Analysis on the Degradation of Optical Properties of High Power White LED

ZHOU Zhou; FENG Shi-wei; GUO Chun-sheng; ZHANG Guang-chen; WU Yan-yan

doi:10.3964/j.issn.1000-0593(2012)10-2611-04

Journals >Spectroscopy and Spectral Analysis >Volume 32 >Issue 10 >Page 2611 > Article

Spectroscopy and Spectral Analysis
Vol. 32, Issue 10, 2611 (2012)

Analysis on the Degradation of Optical Properties of High Power White LED

ZHOU Zhou^*, FENG Shi-wei, GUO Chun-sheng, ZHANG Guang-chen, and WU Yan-yan

Author Affiliations

[in Chinese]

show less

DOI: 10.3964/j.issn.1000-0593(2012)10-2611-04 Cite this Article

ZHOU Zhou, FENG Shi-wei, GUO Chun-sheng, ZHANG Guang-chen, WU Yan-yan. Analysis on the Degradation of Optical Properties of High Power White LED[J]. Spectroscopy and Spectral Analysis, 2012, 32(10): 2611 Copy Citation Text

show less

References

[1] He Guoxing, Yan Huafeng. Optics Express, 2011, 19(3): 2519.

[2] Trevisanello L, Meneghini M, Mura G, et al. IEEE Transactions on Device and Materials Reliability, 2008, 8(2): 304.

[3] Baur J, Baumann F, Peter M, et al. Physica Status Solidi C, 2009, 6(S2): S905.

[4] Burqin J, Jubera V, Debe’da H, et al. Journal of Materials Science, 2011, 46(7): 2235.

[5] Lin Yeong-Her, You Jiun-Pyng, Lin Yuan-Chang, et al. IEEE Transactions on Components and Packaging Technologies, 2010, 33(4): 761.

[7] Meneghesso G, Levada S, Zanoni E, et al. Microelectronics Reliability, 2003, 43(9-11): 1737.

[8] Hu Jianzheng, Yang Lianqiao, Moo Wha Shin, et al. Semicond. Sci. Technol., 2007, 22( 12): 1249.

[10] Gu Yimin, Nadarajah Narendran. Proceedings of the SPIE-The International Society for Optical Engineering, 2004, 5187(1): 107.

[11] Cao X A, Sandvik P M, LeBoeuf S F, et al. Microelectronics Reliability, 2003, 43(12): 1987.

Download Citation

Save the article for my favorites

Paper Information