• Opto-Electronic Engineering
  • Vol. 34, Issue 3, 93 (2007)
[in Chinese]1、2 and [in Chinese]1
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  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: Cite this Article
    [in Chinese], [in Chinese]. Image denoising based on local statistical models in wavelet domain[J]. Opto-Electronic Engineering, 2007, 34(3): 93 Copy Citation Text show less

    Abstract

    [in Chinese], [in Chinese]. Image denoising based on local statistical models in wavelet domain[J]. Opto-Electronic Engineering, 2007, 34(3): 93
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