• Acta Optica Sinica
  • Vol. 30, Issue 7, 1916 (2010)
Zhu Jun*, Dai Shixun, Chen Feifei, Shen Xiang, Wang Xunsi, Xu Tiefeng, and Nie Qiuhua
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  • [in Chinese]
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    DOI: 10.3788/aos20103007.1916 Cite this Article Set citation alerts
    Zhu Jun, Dai Shixun, Chen Feifei, Shen Xiang, Wang Xunsi, Xu Tiefeng, Nie Qiuhua. Mid-Infrared Emission Properties of Ho3+ Ion in Nanocrystals Embedded Chalcohalide Glass Ceramics[J]. Acta Optica Sinica, 2010, 30(7): 1916 Copy Citation Text show less

    Abstract

    Glass ceramics based on mass fraction of 0.6% Ho3+-doped 65GeS2-25Ga2S3-10CsI (in molar fraction) chalcohalide glass are prepared by various heat treatment technique. The densities,micro-hardness,infrared transmission and mid-infrared emission spectra of the samples are measured,and their differences between host glass and glass ceramic are investigated. The results show that the density and micro-hardness markedly increased after heat treatment and further increase with treating duration. X-ray diffraction (XRD) and scanning electron microscope (SEM) measurements indicate that GeS2 phase with grain size of 80 nm are precipitated after treating the host glass at 440 ℃ for 12 h,and the mid-infrared emissions of Ho3+ ions of this glass ceramic sample at 2.0 μm and 2.9 μm are enhanced significantly.
    Zhu Jun, Dai Shixun, Chen Feifei, Shen Xiang, Wang Xunsi, Xu Tiefeng, Nie Qiuhua. Mid-Infrared Emission Properties of Ho3+ Ion in Nanocrystals Embedded Chalcohalide Glass Ceramics[J]. Acta Optica Sinica, 2010, 30(7): 1916
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