• Infrared and Laser Engineering
  • Vol. 50, Issue 11, 20210218 (2021)
Yanwei Li, Qingjing Gao, Haodong Wei, and Jiangtao Li
Author Affiliations
  • Harbin New Optoelectronics Technology CO. LTD., Harbin 150028, China
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    DOI: 10.3788/IRLA20210218 Cite this Article
    Yanwei Li, Qingjing Gao, Haodong Wei, Jiangtao Li. Design of infrared point source interference device with high frame frequency and wide temperature range[J]. Infrared and Laser Engineering, 2021, 50(11): 20210218 Copy Citation Text show less
    New infrared interference system for terminal guidance
    Fig. 1. New infrared interference system for terminal guidance
    System working principle
    Fig. 2. System working principle
    Schematic diagram of control system
    Fig. 3. Schematic diagram of control system
    Infrared point source interference device
    Fig. 4. Infrared point source interference device
    Transmittance of sapphire window
    Fig. 5. Transmittance of sapphire window
    Continuous conductive structure
    Fig. 6. Continuous conductive structure
    Schematic diagram of test device
    Fig. 7. Schematic diagram of test device
    Result of test
    Fig. 8. Result of test
    Test results of 3 μm stainless steel sheet
    Fig. 9. Test results of 3 μm stainless steel sheet
    Test results of 2 μm stainless titanium sheet
    Fig. 10. Test results of 2 μm stainless titanium sheet
    Test results of 2 μm stainless nickel sheet
    Fig. 11. Test results of 2 μm stainless nickel sheet
    Measured temperature curve
    Fig. 12. Measured temperature curve
    Dynamic display effect
    Fig. 13. Dynamic display effect
    NumberMaterailDensity/ kg·m−3Elastic modulus/ GPa Poisson ratioThermal conductivity/ W·m−1·K−1Specific heat capacity/ J·kg−1·K−1Melting point/ Boiling point/
    1C2 260331407103 5504 027
    2Ti4 5071100.32225201 6683 287
    3Fe7 8472110.29804491 5382 861
    4Co8 9002090.311004211 4952 927
    5Ni8 9082000.31914451 4552 913
    6Cu8 9201300.34400384.41 084.622 927
    7Mo10 2803290.311392512 6234 639
    8Ta16 6501860.34571403 0175 458
    9W19 2504110.281701323 4225 555
    10Pt21 0901680.387213317 68.33 825
    11Au19 3002200.44320129.11 064.182 856
    1206Cr9Ni107 9301 9300.2721.5 (500 ℃)5001 398
    Table 1. Performance of high temperature resistant material
    NumberMaterialC/ J·kg−1·K−1ρ/ kg·m−3ρ0/ Ω·m t/s T/K b/mm a/μm
    I=1 A I=2 A I=3 A I=5 A
    1W13219 2505.00E-080.150011.983 7993.9675985.951 3979.918 995
    2Mo25110 2805.00E-080.150011.968 6413.9372835.905 9249.843 206
    3Ta14016 6501.30E-070.150013.339 7626.67952410.019 2916.698 81
    4Cu384.48 9201.70E-080.150010.9957841.0015692.987 3534.978 922
    5Au129.119 3002.20E-080.150011.328 8762.6577533.986 6296.644 382
    6Ti5204 5004.20E-070.150015.99144711.9828917.974 3429.957 23
    706Cr19Ni105007 9307.30E-070.150016.132 12912.1362618.204 3930.340 65
    8Ni4458 9086.80E-080.150011.8522493.7044985.556 7479.261 244
    Table 2. Thickness parameter
    MaterialThickness/ μm Time (500-1 000 ℃)/ ms Time (1 000-500 ℃)/ ms Power/ W
    06Cr19Ni103507818.8
    Ti2505033.9
    Ni2507516.4
    Table 3. Summary of test results
    Yanwei Li, Qingjing Gao, Haodong Wei, Jiangtao Li. Design of infrared point source interference device with high frame frequency and wide temperature range[J]. Infrared and Laser Engineering, 2021, 50(11): 20210218
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