Target recognition based on space location relationship of the sample vector

[in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]

Journals >Opto-Electronic Engineering >Volume 33 >Issue 2 >Page 16 > Article

Opto-Electronic Engineering
Vol. 33, Issue 2, 16 (2006)

Target recognition based on space location relationship of the sample vector

[in Chinese]¹, [in Chinese]², [in Chinese]¹, and [in Chinese]¹

Author Affiliations

¹[in Chinese]

²[in Chinese]

show less

DOI: Cite this Article

[in Chinese], [in Chinese], [in Chinese], [in Chinese]. Target recognition based on space location relationship of the sample vector[J]. Opto-Electronic Engineering, 2006, 33(2): 16 Copy Citation Text

show less

References

[2] Davidmj.TAX,Robert P.W.DUIN.Support Vector Data Description[J].Machine Learning,2004,54(1):45-66.

[3] S.Z.LI,J.W.LU.Face recognition using the nearest feature line method[J].IEEE Trans.Neural Networks,1999,10 (2):439-443.

[4] J.T.CHIEN,C.C.WU.Discriminant wavelet faces and nearest feature classifiers for face recognition[J].IEEE Trans.Pattern Anal.Mach.Intellience,2002,24 (12):1644-1649.

[5] Wenming ZHENG,Li ZHAO,Cairong ZOU.Locally nearest neighbor classifiers for pattern classification[J].Pattern Recognition,2004,37(6):1307-1309.

[in Chinese], [in Chinese], [in Chinese], [in Chinese]. Target recognition based on space location relationship of the sample vector[J]. Opto-Electronic Engineering, 2006, 33(2): 16

Download Citation

Tools

Save the article for my favorites

Paper Information