[1] Cao Xinyu,Xu Shoude,Huang Huijin,et al..The high precision online measurement of lens-to-lens interval [J].Optical Instruments,1992,14(3):20-24.
[2] Li Fangling.Improving measurement of axial clearance during the assembly of the optical chamber of the missiles [J].Machinery Design & Manufacture,2009,(1):130-131.
[3] Goncharov A V,Bailón L L,Devaney N M,et al..Optical testing of lens systems with concentric design [C].SPIE,2009,7389:738912.
[4] Kunkel M,Schulze J.Noncontact measurement of central lens thickness [J].Glass Science and Technology,2005,78(5):245-247.
[5] Qiao Yang,Zhang Ning,Xu Xiping,et al..Design of lens thickness measurement system based on confocal technology[J].Chinese Journal of Scientific Instrument,2011,32(7):1635-1641.
[6] Ziebarth N,Manns F,Acosta A C,et al..Non-contact optical measurement of lens capsule thickness during simulated accommodation [C].SPIE,2005,5688:19-25.
[7] Dierke H,Tutsch R.Optical measurement of the layer thickness of transparent materials [C].SPIE,2012,8430:843008.
[8] Zhao W,Sun R,Qiu L,et al..Lenses axial space ray tracing measurement [J].Opt Express,2010,18(4):3608-3617.
[9] Shi Libo,Qiu Lirong,Wang Yun,et al..Development of lens central thickness measurement system using laser differential confocal microscopy [J].Chinese Journal of Scientific Instrument,2012,33(3):683-688.
[10] Liu Wenli,Shi Libo,Sun Ruoduan,et al..Measurement Method and Apparatus for Lenses Axial Space by Confocal Technique:China,CN101782373A[P].[2010-03-17].
[11] Liu Wenli,Shi Libo,Sun Ruoduan,et al..Measurement Method and Apparatus for Central Lens Thickness by Confocal Technique:China,CN101788271A [P].[2010-03-17].
[12] Langehanenberg P,Dumitrescu E,Heinisch J,et al..Automated measurement of centering errors and relative surface distances for the optimized assembly of micro-optics [C].SPIE,2011,7926:79260E.
[13] Langehanenberg P,Ruprecht A,Off D,et al..Highly accurate measurement of lens surface distances within optical assemblies for quality testing [C].SPIE,2013,8844:88444F.
[14] Langehanenberg P,Stickler D,Lüerb B,et al..Verification of the optical design by simultaneous measurement of centering errors and relative surface distances inside of optical systems [C].SPIE,2012,8550:85500Y.
[15] Langehanenberg P,Heinisch J,Dumitrescu E.High precision geometrical characterization and alignment of miniaturized optics [C].SPIE,2012,8249:82490U.
[17] Wilhelm R,Courteville A,Garcia F.A novel low coherence fibre optic interferometer for position and thickness measurements with unattained accuracy [C].SPIE,2006,6189:618918.
[18] Courteville A,Wilhelm R,Delaveau M,et al..Contact-free on-axis metrology for the fabrication and testing of complex optical systems[C].SPIE,2005,5965:596510.
[19] Wilhelm R,Courteville A,Garcia F.Dimensional metrology for the fabrication of imaging optics using a high accuracy low coherence interferometer [C].SPIE,2005,5856:469-480.
[20] Courteville A,Garcia F,Nel L.Positioning of optical payload:SALT telescope [C].SPIE,2004,5495:463-473.
[21] Guo Banghui,Li Ming,Sun Qiang.Research of dispersion in measurement of optical lens gap [J].Laser & Optoelectronics Progress,2013,51(6):061204.
[22] Ding Zhihua,Zhao Chen,Bao Wen,et al..Advances in doppler optical coherence tomography[J].Laser & Optoelectronics Progress,2013,50(8):080005.
[23] Guo Tong,Li Feng,Ni Lianfeng,et al..Microstructure surface topography measurement based on color images of white light interferometry [J].Acta Optica Sinica,2014,34 (2):0212003.
[24] Li Chuansheng,Zhang Chunxi,Wang Xiaxiao,et al..White light interferometry for pigtail polarization crosstalk of Tidiffused LiNbO3 integrated optic phase modulator [J].Chinese J Lasers,2013,40(5):0508003.
[25] Jiang Jiadong,Yuan Daocheng,Pu Jie.Research on on-line-measuring clearance of assembly parts based on image measurement technology [J].Journal of Transducer Technology,2006,24(12):26-28.
[26] Wei QuanZhong.Non-Contact Measuring Apparatus and Method for Air Gap of Optical System:China,CN1428627A [P].[2003-07-09].
[27] De Groot P.Optical Gap Measuring Apparatus and Method:United States,US5953125A [P].[1999-09-14].
[28] Liu Yongzhi,Ye Yutang,Liu Xu,et al..An Appratus for Measuring Micro Optical Interval:China,CN2166414Y [P].[1994-05-25].