• Journal of Infrared and Millimeter Waves
  • Vol. 24, Issue 1, 53 (2005)
[in Chinese]1, [in Chinese]1, [in Chinese]1, and [in Chinese]2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: Cite this Article
    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. SOI波导弯曲损耗改善方法的研究RESEARCH ON IMPROVED METHODS OF REDUCTION OF BEND LOSS OF SILICON-ON-INSULATOR WAVEGUIDES[J]. Journal of Infrared and Millimeter Waves, 2005, 24(1): 53 Copy Citation Text show less

    Abstract

    Improved methods of reduction of bend loss of silicon-on-insulator waveguides were simulated and analyzed by means of effective index method (EIM) and two dimensional beam propagation method (2D-BPM). The simulation results indicate that two different methods, one of which are introducing an offset at the junction of two waveguides and the other is etching groove at the outside of bend waveguide, can decrease bend loss. And the later one is more effective. Meanwhile, experiments validate them. By etching groove, the insertion loss of bend waveguide of R=16mm, transverse displacement 70μm was decreased 5dB. And its bend loss was almost eliminated.
    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. SOI波导弯曲损耗改善方法的研究RESEARCH ON IMPROVED METHODS OF REDUCTION OF BEND LOSS OF SILICON-ON-INSULATOR WAVEGUIDES[J]. Journal of Infrared and Millimeter Waves, 2005, 24(1): 53
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