[1] Xue Qingwen, Li Guohua. Half-shade method for measuring the phase retardation of quarter-wave plate[J]. Journal of Optoelectronics·Laser, 1998, 9(2): 150-151. (in Chinese)

[2] Xiao Haosu, Zhang Yunqiang. Precision analysis of polarization interference method for measuring stress birefringence of crystal[J]. Infrared and Laser Engineering, 2011, 40(2): 273-275. (in Chinese)

[3] Tan Qiao, Xu Qifeng. New method for retardance measurement of a quarter-wave plate[J]. Infrared and Laser Engineering, 2016, 45(7): 0717002. (in Chinese)

[4] Ren Hongliang, Wang Jiuyang. Measuring phase retardation and fast axis azimuth of a wave plate using michelson interferometer[J]. Chinese Journal of Lasers, 2008, 35(2): 250-252. (in Chinese)

[5] Hu jianming, Wang Xiangzhao. Measure phase retardation of wave plate based on photoelastic modulation[J]. Acta Optica Sinica, 2006, 26(11): 02532239. (in Chinese)

[6] Zeng Aijun, Li Fanyue. Simultaneous measurement of retardance and fast axis angle of a quarter-wave plate using one photo-elastic modulator[J]. Applied Optics, 2011, 50(22): 4347-4352.

[7] Li Kewu, Wang Zhibin. High sensitive measurement of optical rotation based on photo-elastic modu-lation[J]. Acta Phys Sinica, 2015, 64(18): 184206. (in Chinese)

[8] Li Kewu, Wang Liming. Measurement of residual birefringence combined photo-elastic modulation with electro-optic modulation[J]. Chinese Journal of Lasers, 2016, 43(5): 0508003. (in Chinese)

[9] Wang Shuang, Wang Zhibin. Realizing the measure-ment of the crystal electro-optic coefficient by photo-elastic modulation with digital phase locking[J]. Acta Photonica Sinica, 2017, 46(10): 1012001. (in Chinese)