[1] Wright P J, Rheinhorn S, Some D. Design and application of Gray Field/sup TM/ Technology for Defect Inspection Systems. Advanced Semiconductor Manufacturing Conference. 2001 IEEE/SEMI, 2001

[2] Badger J C, Enright S T. Automate surface inspection system. Iron and Steel Engng., 1996, (3):48～51

[3] Vascotto M. High speed surface defect identification on steel strip. Metallurgical Plant and Technology, 1996, (4):70～73