An integrated technique for measuring the laser power and spectral parameters of a single bar in a kilowatt class semiconductor laser array is proposed. The beam of any single bar in the laser array is separated from the beam of other bars by the self-developed diaphragm, and the power and spectral parameters of the separated single bar beam are integrated tested by using the integrating sphere, and then compared with the results of the integrated test of the power and spectral parameters of the whole array. The experimental results show that any single bar beam in the 1 kW laser array can be separated from other bar beams by the self-developed diaphragm, and the transmittance of the diaphragm to the single bar beam is 98%.Combining with the integrating sphere integrated test system, all the bars in the laser array can be tested individually, which overcomes the traditional problem of unpacking the single bar in the stack array. In addition, the system can scan the whole stack quickly and reflect each bar in the stack directly.