[1] Townsend P A, Foster J R, Chastain J R A, et al. IEEE Trans. Geosci. Remote Sens., 2003, 41: 1347.
[2] Lin R P, Dennis B R, Hurford G J, et al. Solar Physics, 2002, 210: 3.
[3] Richard M Levenson, Elliot S Wachman, Niu Wenhua, et al. SPIE Proceedings, 1998, 3438: 300.
[4] Ben-Dor E, Taylor R G, Hill J, et al. Adv. Agron., 2008, 97: 321.
[5] Basedow R W, Carmer D C, Anderson M E. SPIE, Proceedings, 1995, 2480: 258.
[6] Bell R J. Introductory Fourier Transform Spectroscopy. New York: Acadamic Press, 1972.
[7] Morris H, Hoyt C, Treado P. Appl. Spectrosc., 1994, 48: 857.
[8] Gehm M E, McCain S T, Pitsianis N P, et al. Appl. Opt., 2006, 45: 2965.
[9] Ashwin A Wagadarikar, Nikos P Pitsianis, Sun Xiaobai, et al. SPIE, Proceedings, 2008, 7076(2): 1.
[10] Arguello H, Arce G R. J. Opt. Soc. Am. A, 2011, 28: 2401.
[11] Smith W J. Modern Optical Engineering: The Design of Optical Systems Third Edition, McGraw-Hill, NewYork, 2000. 347.
[12] Optikos Corporation. How to Measure MTF and Other Properties of Lenses. Technical Paper, 1999.
[13] Tsaig Y, Donoho D L. IEEE Trans. Info. Theory, 2006, 52: 1289.
[14] Mallat S, Zhang Z. IEEE Trans. Sig. Proc., 1993, 41: 3397.
[15] Figueiredo M A T, Nowak R D, Wright S J. IEEE J. Sel. Top. Sign. Proces., 2007, 1(4): 586.
[16] Bioucas-Dias J M, Figueiredo M A T. IEEE Trans. Image Process, 2007, 16: 2992.
[17] ISO 12233, Photography-Electronic Still Picture Cameras-Resolution Measurements, 2000.
[18] Burns P. Proc. IS & T PICS Conference, 2000. 135.
[19] Estribeau M, Magnan P. SPIE Proceedings, 2004, 5251: 243.
[20] Robin B Jenkin, Ralph E Jacobson, Mark A Richardson, et al. SPIE Proceedings, 2004, 5670: 557.
[21] Peter D Burns. Proc. SPIE-IS & T. Electronic Imaging Symposium, 2005, 5668: 255.
[22] Candes E J, Wakin M B. IEEE Signal Process. Mag., 2008, 25: 21.
[23] Figueiredo M A T, Nowak R D, Wright S J. IEEE J. Sel. Top. Sign. Proces., 2007, 1(4): 586.
[24] http://losburns.com/imaging/software/SFRedge/sfrmat3_post/index.html.