• Infrared and Laser Engineering
  • Vol. 51, Issue 3, 20210400 (2022)
Chunyu Yuan1, Yang Cao1, Yong Deng1, and Shulian Zhang2、*
Author Affiliations
  • 1School of Mechanical Engineering, Nantong University, Nantong 226019, China
  • 2The State Key Lab of Precision Measurement Technology and Instrument, Department of Precision Instruments, Tsinghua University, Beijing 100084, China
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    DOI: 10.3788/IRLA20210400 Cite this Article
    Chunyu Yuan, Yang Cao, Yong Deng, Shulian Zhang. Improving the measurement accuracy of refractive index of GaAs and Sapphire Crystal by laser feedback interferometry[J]. Infrared and Laser Engineering, 2022, 51(3): 20210400 Copy Citation Text show less
    References

    [2] Li Jingzhen. Optical Hbook[M]. Xi''an: Shaanxi Science Technology Press, 2010. (in Chinese)

    [3] Masahiko Daimon, Akira Masumura. High-accuracy measurements of the refractive index and its temperature coefficient of calcium fluoride in a wide wavelength range from 138 to 2326 nm. Appl Opt, 41, 5275-5281(2002).

    [4] S P Talim. Measurement of the refractive index of a prism by a critical angle method. J Opt A: Pure Appl Opt, 25, 157-165(2010).

    [5] Victor G Plotnichenko, Vyacheslav O Sokolov. Influence of absorption on the refractive index determination accuracy by the minimum deviation method. Appl Opt, 57, 639-647(2018).

    [6] S Monneret, P Huguet-Chantme, F Flory. M-lines technique: prism coupling measurement and discussion of accuracy for homogeneous waveguides. J of Opt A: Pure Appl Opt, 2, 188-195(2000).

    [7] G D Gillen, S Guha. Use of Michelson and Fabry-Perot interferometry for independent determination of the refractive index and physical thickness of wafers. Appl Opt, 44, 344-347(2005).

    [8] R Ince, E Hueseyinoglu. Decoupling refractive index and geometric thickness from interferometric measurements of a quartz sample using a fourth-order polynomial. Appl Opt, 46, 3498-503(2007).

    [9] C Giuseppe, F Pietro, I Mario, et al. Method for measuring the refractive index and the thickness of transparent plates with a lateral-shear, wavelength-scanning interfero -meter. Appl Opt, 42, 3882(2003).

    [10] C H Joo, L H Hong, M H Seb, et al. Measurement of refractive index and thickness of transparent plate by dual-wavelength interference. Opt Express, 18, 9429-34(2010).

    [11] K S Hwan, L S Hun, L J In, et al. Absolute refractive index measurement method over a broad wavelength region based on white-light interferometry. Appl Opt, 49, 910-4(2010).

    [12] N A Andrushchak, O I Syrotynsky, I D Karbovnyk, et al. Interferometry technique for refractive index measurements at subcentimeter wavelengths. Microw Opt Technol Let., 53, 1193-1196(2011).

    [13] J Li, Y R Wang, X F Meng, et al. Simultaneous measurement of optical inhomogeneity and thickness variation by using dual-wavelength phase-shifting photorefractive holographic interferometry. Opt Laser Technol, 56, 241-246(2014).

    [14] E Lacot, R Day, F Stoeckel. Laser optical feedback tomography. Opt Lett, 24, 744-746(1999).

    [15] Yu Daoyin, Tan Hengying. Engineering Optics[M]. Beijing: Machinery Industry Press, 2011. (in Chinese)

    [16] Yucai Ni. Modification of Edlén equation for air refractive index. Metrological Technique, 22-27(1998).

    [17] Shi Changyan. Guide f evaluation presentation of measurement uncertainty[M]. Beijing: Chinese Metrology Press, 2000. (in Chinese)

    [18] Zhenghui Zhuang, Xianqiu Wu, Hao Chen. The derivation of Bessel's formula and its physical meaning. College Physics Experiment, 23, 80-82(2010).

    [19] T Skauli, P S Kuo, K L Vodopyanov, et al. Improved dispersion relations for GaAs and applications to nonlinear optics. Journal of Applied Physics, 94, 6447-6455(2003).

    Chunyu Yuan, Yang Cao, Yong Deng, Shulian Zhang. Improving the measurement accuracy of refractive index of GaAs and Sapphire Crystal by laser feedback interferometry[J]. Infrared and Laser Engineering, 2022, 51(3): 20210400
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