• Infrared and Laser Engineering
  • Vol. 45, Issue 6, 633001 (2016)
Fu Yifan1、*, Wu Jian1, and He Honghui2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: 10.3788/irla201645.0633001 Cite this Article
    Fu Yifan, Wu Jian, He Honghui. Non-linear correction of area CMOS sensor in polarization imaging system[J]. Infrared and Laser Engineering, 2016, 45(6): 633001 Copy Citation Text show less
    References

    [1] Du E, He H, Zeng N, et al. Mueller matrix polarimetry for differentiating characteristic features of cancerous tissues[J]. Journal of Biomedical Optics, 2014, 19(7): 1729-1733.

    [2] Novikova T, Pierangelo A, De Martino A, et al. Polarimetric imaging for cancer diagnosis and staging[J]. Optics and Photonics News, 2012, 23(10): 26-33.

    [3] Janesick J R. Scientific Charge-coupled Devices[M]. Bellingham: SPIE Press, 2001.

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    [5] Wang Hua, Cao Jianzhong, Wang Huawei, et al. Column fixed pattern noise correction of the CMOS image sensor based on estimation method[J]. Infrared and Laser Engineering, 2013, 42(7): 1928-1932. (in Chinese)

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    [9] Dong Jianting, Yang Xiaole, Dong Jie. Performance test and image processing of area CMOS image sensor[J]. Infrared and Laser Engineering, 2013, 42(12): 3396-3401. (in Chinese)

    [10] Azzam R M A. Photopolarimetric measurement of the Mueller matrix by Fourier analysis of a single detected signal[J]. Optics Letters, 1978, 2(6): 148-150.

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    Fu Yifan, Wu Jian, He Honghui. Non-linear correction of area CMOS sensor in polarization imaging system[J]. Infrared and Laser Engineering, 2016, 45(6): 633001
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