• Journal of Infrared and Millimeter Waves
  • Vol. 22, Issue 1, 56 (2003)
[in Chinese]1、2, [in Chinese]2, [in Chinese]1, [in Chinese]1, [in Chinese]1, [in Chinese]1, and [in Chinese]1、2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: Cite this Article
    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. SIMULATION STUDY FOR OPTICAL FILTER THIN-FILM DEPOSITION MONITORING[J]. Journal of Infrared and Millimeter Waves, 2003, 22(1): 56 Copy Citation Text show less
    References

    [1] Fornier Bousquet A, Kowalczyk R. Optical filters: Monitoring process allowing the auto-correction of thickness errors. Thin Solid Films, 1972, 13: 285 - 290

    [2] Christi Madsen K, Jian Zhao H. Optical Filter Design and Analysis. New York: John Wiley & Sons, Inc., 1999

    [3] Zoller A, Boos M, Herrmann R, et al. Optical thickness monitoring of dielectric optical filters using a new in-situ phometer with high signal resolution and excellent long-term-stability. SPIE, 1988, 1019: 106- 113

    [4] Willey R R. Achieving narrow bandpass filters which meet the requirements for DWDM. Thin Solid Films, 2001, 398/399: 1 - 9

    [5] Pan J J, Zhou F Q, Zhou M. Thin films improve 50GHz DWDM devices. Laser Focus World, 2002, 38: 111 - 116

    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. SIMULATION STUDY FOR OPTICAL FILTER THIN-FILM DEPOSITION MONITORING[J]. Journal of Infrared and Millimeter Waves, 2003, 22(1): 56
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