Calibration of Sensitivity and Application of X-Ray Diode (Al)

[in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]

Journals >Acta Optica Sinica >Volume 15 >Issue 7 >Page 939 > Article

Acta Optica Sinica
Vol. 15, Issue 7, 939 (1995)

Calibration of Sensitivity and Application of X-Ray Diode (Al)

[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], and [in Chinese]

Author Affiliations

[in Chinese]

show less

DOI: Cite this Article Set citation alerts

[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Calibration of Sensitivity and Application of X-Ray Diode (Al)[J]. Acta Optica Sinica, 1995, 15(7): 939 Copy Citation Text

show less

Abstract

The conversion efficiency of X-ray-induced electrons for X-ray diodes (Alcathods) was discussed. Sesitivity of Al cathod was calibrated on the monoenergy subkeV X-ray source facility. The application of using X-ray diodes to measure sub-keV Xrop from laser-plasma interaction was introduced.

Keywords

Al Cathod sensitivity X-ray diode

[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Calibration of Sensitivity and Application of X-Ray Diode (Al)[J]. Acta Optica Sinica, 1995, 15(7): 939

Download Citation

Set citation alerts for the article

Tools

Set citation alerts for the article

Save the article for my favorites

Paper Information