Opto-electronic theodolite multiple ballistic test based on fuzzy c-means clustering

[in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]

Journals >Opto-Electronic Engineering >Volume 33 >Issue 10 >Page 5 > Article

Opto-Electronic Engineering
Vol. 33, Issue 10, 5 (2006)

Opto-electronic theodolite multiple ballistic test based on fuzzy c-means clustering

[in Chinese]^1、2、3, [in Chinese]², [in Chinese]², [in Chinese]^1、2、3, and [in Chinese]^2、3

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[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Opto-electronic theodolite multiple ballistic test based on fuzzy c-means clustering[J]. Opto-Electronic Engineering, 2006, 33(10): 5 Copy Citation Text

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