[1] M. Kruer, L. Esterowitz, R. Allen et al.. Thermal models for laser damage in InSb photovoltaic and photoconductive detectors［J］. Infrared Phys., 1976, 16(3): 375～384

[2] E. J. Yoffa. Role of carrier diffusion in lattice heating during pulsed laser annealing［J］. Appl. Phys. Lett., 1980, 36(1): 37～38

[3] D. M. Kim, D. L. Kwong. Laser heating of semiconductors-effect of diffusion in nonlinear dynamic heat transport progress［J］. J. Appl. Phys., 1981, 52(8): 4995～5006

[4] D. M. Kim, D. L. Kwong. Pulsed laser annealing of single-crystal and ion implanted semiconductors［J］. IEEE J. Quantum Electron., 1982, 18(2): 224～232

[5] Ma Liqin, Cheng Xiang′ai, Lu Qisheng et al.. Research of choas in HgCdTe (PV) detectors induced by 1.319 μm laser［J］. Laser & Infrared, 2003, 33(1): 61～63

[6] Jiang Tian, Cheng Xiang′ai, Jiang Houman et al.. Investigation of the response mechanism of photovoltaic semiconductor with sub-bandgap photons［J］. Acta Physica Sinica, 2011, 60(10): 107305

[7] Fu Bo, Zhang Cuijuan, Luo Fei et al.. Studies on pulsed laser induced damage of silicon on insulator material［J］. Acta Optica Sinica, 2010, 30(5): 1413～1417

[8] Zhu Zhiwu, Cheng Xiang′ai, Si Lei et al.. Numerical modeling of optical field characteristic of monolayer film irradiated by femtosecond laser pulse［J］. Chinese J. Lasers, 2011, 38(1): 0102003

[9] Qiu Dongdong, Zhang Zhen, Wang Rui et al.. Mechanism research of pulsed-laser induced damage to CCD imaging devices［J］. Acta Optica Sinica, 2011, 31(2): 0214006

[10] Fang Dan. Skill analysis of readout intergrated circuits of IRFPA［J］. Infrared Technology, 2004, 26(2): 23～28

[11] Dong Gang, Yang Yintang. Crosstalk effects in mixed-signal CMOS IC［J］.Semiconductor Technology, 2002, 27(10): 34～37

[12] Cheng Xiang′ai, Lu Qisheng, Ma Liqin et al.. Experimental study of HgCdTe(PV) detector irradiated by CW 1.319 μm laser［J］. Acta Optica Sinica, 2003, 23(5): 622～626

[13] Lin Yancheng, Xiao Gonghai, Shu Rong. Effects of bias voltage on the performance of solar-blinded AlGaN［J］. Laser & Infrared, 2010, 40(3): 260～263

[14] Zhu Junhao. Narrow Energy Gap Semiconductor Physics［M］. Beijing: Science Press, 2005. 811～812

[15] Jin Xiangliang, Chen Jie, Qiu Yulin. Low-power loe-noise correlated double sampling circuit for CMOS image sensor［J］. J. Circuits and Systems, 2003, 8(3): 24～27

[16] Shen Xiaoyan. Methods of canceling noises in CMOS read-out integrated circuit［J］. Infrared and Laser Engineering, 2004, 33(6): 659～661