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    Journals >Laser & Optoelectronics Progress >Volume 49 >Issue 9 >Page 91404 > Article
    • Laser & Optoelectronics Progress
    • Vol. 49, Issue 9, 91404 (2012)
    Long-Term Aging and Failure Analysis for 980 nm Laser Diodes
    Liu Bin1、*, Liu Yuanyuan2, and Cui Bifeng3
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  • 1[in Chinese]
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  • 3[in Chinese]
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    DOI: 10.3788/lop49.091404 Cite this Article Set citation alerts
    Liu Bin, Liu Yuanyuan, Cui Bifeng. Long-Term Aging and Failure Analysis for 980 nm Laser Diodes[J]. Laser & Optoelectronics Progress, 2012, 49(9): 91404 Copy Citation Text show less
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    Liu Bin, Liu Yuanyuan, Cui Bifeng. Long-Term Aging and Failure Analysis for 980 nm Laser Diodes[J]. Laser & Optoelectronics Progress, 2012, 49(9): 91404
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    Paper Information
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