Researching | Broadband transverse displacement sensing of silicon hollow nanodisk under focused radial polarization illumination in the near-infrared region

Journals >Chinese Optics Letters >Volume 18 >Issue 6 >Page 063602 > Article

Chinese Optics Letters
Vol. 18, Issue 6, 063602 (2020)

Broadband transverse displacement sensing of silicon hollow nanodisk under focused radial polarization illumination in the near-infrared region

Jianxin Wang¹, Xianghui Wang^1、*, and Ming Zeng²

Author Affiliations

¹Institute of Modern Optics, Tianjin Key Laboratory of Micro-scale Optical Information Science and Technology, Nankai University, Tianjin 300350, China

²School of Electrical Engineering and Automation, Tianjin University, Tianjin 300072, China

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DOI: 10.3788/COL202018.063602 Cite this Article Set citation alerts

Jianxin Wang, Xianghui Wang, Ming Zeng. Broadband transverse displacement sensing of silicon hollow nanodisk under focused radial polarization illumination in the near-infrared region[J]. Chinese Optics Letters, 2020, 18(6): 063602 Copy Citation Text

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Jianxin Wang, Xianghui Wang, Ming Zeng. Broadband transverse displacement sensing of silicon hollow nanodisk under focused radial polarization illumination in the near-infrared region[J]. Chinese Optics Letters, 2020, 18(6): 063602

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