Broadband transverse displacement sensing of silicon hollow nanodisk under focused radial polarization illumination in the near-infrared region

Jianxin Wang; Xianghui Wang; Ming Zeng

doi:10.3788/COL202018.063602

Journals >Chinese Optics Letters >Volume 18 >Issue 6 >Page 063602 > Article

Chinese Optics Letters
Vol. 18, Issue 6, 063602 (2020)

Broadband transverse displacement sensing of silicon hollow nanodisk under focused radial polarization illumination in the near-infrared region

Jianxin Wang¹, Xianghui Wang^1、*, and Ming Zeng²

Author Affiliations

¹Institute of Modern Optics, Tianjin Key Laboratory of Micro-scale Optical Information Science and Technology, Nankai University, Tianjin 300350, China

²School of Electrical Engineering and Automation, Tianjin University, Tianjin 300072, China

show less

DOI: 10.3788/COL202018.063602 Cite this Article Set citation alerts

Jianxin Wang, Xianghui Wang, Ming Zeng. Broadband transverse displacement sensing of silicon hollow nanodisk under focused radial polarization illumination in the near-infrared region[J]. Chinese Optics Letters, 2020, 18(6): 063602 Copy Citation Text

EndNote(RIS)

BibTex

Plain Text

show less

Cited By

Article index updated: Apr. 3, 2024

Citation counts are provided from Web of Science. The counts may vary by service, and are reliant on the availability of their data.