• Spectroscopy and Spectral Analysis
  • Vol. 29, Issue 4, 935 (2009)
LIU Shi-yuan1、*, ZHANG Chuan-wei2, SHEN Hong-wei2, and GU Hua-yong2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: Cite this Article
    LIU Shi-yuan, ZHANG Chuan-wei, SHEN Hong-wei, GU Hua-yong. Model-Based FTIR Reflectometry Measurement System for Deep Trench Structures of DRAM[J]. Spectroscopy and Spectral Analysis, 2009, 29(4): 935 Copy Citation Text show less
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    LIU Shi-yuan, ZHANG Chuan-wei, SHEN Hong-wei, GU Hua-yong. Model-Based FTIR Reflectometry Measurement System for Deep Trench Structures of DRAM[J]. Spectroscopy and Spectral Analysis, 2009, 29(4): 935
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