• Opto-Electronic Engineering
  • Vol. 31, Issue 6, 9 (2004)
[in Chinese] and [in Chinese]
Author Affiliations
  • [in Chinese]
  • show less
    DOI: Cite this Article
    [in Chinese], [in Chinese]. Limitation of scalar method to the analysis and design of diffractive optics elements[J]. Opto-Electronic Engineering, 2004, 31(6): 9 Copy Citation Text show less
    References

    [2] WANG W, LI T, LI Y P. A hybrid algorithm for the design of DOE in uniform illumination[J]. Optics communications.2000,181(7): 261-265.

    [3] MOHARAM M G, GAYLORD T K. Diffraction analysis of dielectric surface-relief gratings[J]. J.Opt. Soc. Am, 1982, 72(10):1385-1392.

    [4] SONG P, MORRIS M. Efficient implementation of rigorous coupled-wave analysis for surface-relief gratings[J].J.Opt. Soc. Am.A, 1995, 12(5): 1087-1096.

    [5] MOHARAM J, POMMET D A, GRANN E B. Stable implementation of the rigorous coupled-wave analysis for surface-relief gratings: enhanced transmittance matrix approach[J]. J.Opt. Soc. Am.A, 1995, 12(5): 1077-1086.

    [6] MOHARAM M G, GRANN E B, POMMET D A. Formulation for stable and efficient implementation of the rigorous couple-wave analysis of binary gratings[J]. J.Opt. Soc. Am.A, 1995, 12(5): 1068-1076.

    [10] WU Y, XU J Z, ZHAO Y Q, et al. Precise design of the pure phase element for quasi-annular beam shaping[J]. SPIE, 2002,4914: 430-437.

    CLP Journals

    [1] ZHAO Yuan, CAI Dongmei, DING Xiaona, WANG Kun, TI Peipei. Design and Simulation of a Diffractive Pyramid Wavefront Sensor[J]. Opto-Electronic Engineering, 2013, 40(11): 27

    [2] Zheng Xunjiang, Zhang Guangjun, Mao Xiaonan. A very high precision errors test method for star sensor[J]. Infrared and Laser Engineering, 2015, 44(5): 1605

    [3] Yang Liangliang, Cui Qingfeng, Liu Tao, Xue Changxi. Measurement of Diffraction Efficiency for Diffractive Optical Elements[J]. Acta Optica Sinica, 2012, 32(4): 412007

    [in Chinese], [in Chinese]. Limitation of scalar method to the analysis and design of diffractive optics elements[J]. Opto-Electronic Engineering, 2004, 31(6): 9
    Download Citation