• Chinese Optics Letters
  • Vol. 18, Issue 9, 092501 (2020)
Jingzhan Shi, Fangzheng Zhang*, De Ben, and Shilong Pan
Author Affiliations
  • Key Laboratory of Radar Imaging and Microwave Photonics, Ministry of Education, Nanjing University of Aeronautics and Astronautics, Nanjing 210016, China
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    DOI: 10.3788/COL202018.092501 Cite this Article Set citation alerts
    Jingzhan Shi, Fangzheng Zhang, De Ben, Shilong Pan, "Photonic-assisted single system for microwave frequency and phase noise measurement," Chin. Opt. Lett. 18, 092501 (2020) Copy Citation Text show less

    Abstract

    We propose a photonic-assisted single system for measuring the frequency and phase noise of microwave signals in a large spectral range. Both the frequency and phase noise to be measured are extracted from the phase difference between the signal under testing and its replica delayed by a span of fiber and a variable optical delay line (VODL). The system calibration, frequency measurement, and phase noise measurement are performed by adjusting the VODL at different working modes. Accurate frequency and phase noise measurement for microwave signals in a large frequency range from 5 to 50 GHz is experimentally demonstrated.
    E1(t)J0(β)ej[2πfct+φc(t)]+J±1(β)ej[2π(fc±fs)t+φc(t)±φs(t)±π2],(1)

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    E2(t)=[ETE(t)ETM(t)][E1(tτνt)ejγcos[2πfst+φs(t)]ejϕE1(tτνt)ejγcos[2πfst+φs(t)]],(2)

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    E4u(t)J1(β)J0(γ)ej[2π(fcfs)(tτνt)+φc(tτνt)φs(tτνt)]+J0(β)J1(γ)ej[2πfc(tτνt)+φc(tτνt)2πfstφs(t)].(3)

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    E4l(t)J1(β)J0(γ)ej[2π(fcfs)(tτνt)+φc(tτνt)φs(tτνt)π4]+J0(β)J1(γ)ej[2πfc(tτνt)+φc(tτνt)2πfstφs(t)+π4].(4)

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    s11(t)=R1ZLE4u(t)E4u*(t)=s10+A1cos[ψ(t,ν)],s12(t)=R2ZLE4l(t)E4l*(t)=s20+A2sin[ψ(t,ν)],(5)

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    si0=M[s1i(t)]+N[s1i(t)]2,Ai=M[s1i(t)]N[s1i(t)]2,(6)

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    ψ(t,ν)=arctan{[s12(t)s20]A1[s11(t)s10]A2}.(7)

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    fe=slope[ψ(t,ν)]2πν,(8)

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    slope[ψ(t,ν)]=1Ni=1Ntiψi1Ni=1Nti×1Ni=1Nψi1Ni=1Nti2(1Ni=1Nti)2,(9)

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    Le(fm)=Sφs(fm)2=[φs(t)φs(tτ)]psd2|1ejπfmτ|2=Sψ(fm)8sin2(πfmτ),fm0,(10)

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    Jingzhan Shi, Fangzheng Zhang, De Ben, Shilong Pan, "Photonic-assisted single system for microwave frequency and phase noise measurement," Chin. Opt. Lett. 18, 092501 (2020)
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