Photonic-assisted single system for microwave frequency and phase noise measurement

Jingzhan Shi; Fangzheng Zhang; De Ben; Shilong Pan

doi:10.3788/COL202018.092501

Journals >Chinese Optics Letters >Volume 18 >Issue 9 >Page 092501 > Article

Chinese Optics Letters
Vol. 18, Issue 9, 092501 (2020)

Photonic-assisted single system for microwave frequency and phase noise measurement | Editors' Pick

Jingzhan Shi, Fangzheng Zhang^*, De Ben, and Shilong Pan

Author Affiliations

Key Laboratory of Radar Imaging and Microwave Photonics, Ministry of Education, Nanjing University of Aeronautics and Astronautics, Nanjing 210016, China

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DOI: 10.3788/COL202018.092501 Cite this Article Set citation alerts

Jingzhan Shi, Fangzheng Zhang, De Ben, Shilong Pan, "Photonic-assisted single system for microwave frequency and phase noise measurement," Chin. Opt. Lett. 18, 092501 (2020) Copy Citation Text

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Abstract

We propose a photonic-assisted single system for measuring the frequency and phase noise of microwave signals in a large spectral range. Both the frequency and phase noise to be measured are extracted from the phase difference between the signal under testing and its replica delayed by a span of fiber and a variable optical delay line (VODL). The system calibration, frequency measurement, and phase noise measurement are performed by adjusting the VODL at different working modes. Accurate frequency and phase noise measurement for microwave signals in a large frequency range from 5 to 50 GHz is experimentally demonstrated.

Keywords

frequency measurement microwave photonics phase noise measurement

E_{1} (t) \propto J_{0} (β) e^{j [2 π f_{c} t + φ_{c} (t)]} + J_{\pm 1} (β) e^{j [2 π (f_{c} \pm f_{s}) t + φ_{c} (t) \pm φ_{s} (t) \pm \frac{π}{2}]},

(1)

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E_{2} (t) = [\begin{matrix} E_{TE} (t) \\ E_{TM} (t) \end{matrix}] \propto [\begin{matrix} E_{1} (t - τ - ν t) e^{j γ \cos [2 π f_{s} t + φ_{s} (t)]} e^{j ϕ} \\ E_{1} (t - τ - ν t) e^{- j γ \cos [2 π f_{s} t + φ_{s} (t)]} \end{matrix}],

(2)

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E_{4 u} (t) \propto J_{- 1} (β) J_{0} (γ) e^{j [2 π (f_{c} - f_{s}) (t - τ - ν t) + φ_{c} (t - τ - ν t) - φ_{s} (t - τ - ν t)]} + J_{0} (β) J_{- 1} (γ) e^{j [2 π f_{c} (t - τ - ν t) + φ_{c} (t - τ - ν t) - 2 π f_{s} t - φ_{s} (t)]} .

(3)

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E_{4 l} (t) \propto J_{- 1} (β) J_{0} (γ) e^{j [2 π (f_{c} - f_{s}) (t - τ - ν t) + φ_{c} (t - τ - ν t) - φ_{s} (t - τ - ν t) - \frac{π}{4}]} + J_{0} (β) J_{- 1} (γ) e^{j [2 π f_{c} (t - τ - ν t) + φ_{c} (t - τ - ν t) - 2 π f_{s} t - φ_{s} (t) + \frac{π}{4}]} .

(4)

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s_{11} (t) = R_{1} Z_{L} E_{4 u} (t) E_{4 u}^{*} (t) = s_{10} + A_{1} \cos [ψ (t, ν)], s_{12} (t) = R_{2} Z_{L} E_{4 l} (t) E_{4 l}^{*} (t) = s_{20} + A_{2} \sin [ψ (t, ν)],

(5)

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s_{i 0} = \frac{M [s_{1 i} (t)] + N [s_{1 i} (t)]}{2}, A_{i} = \frac{M [s_{1 i} (t)] - N [s_{1 i} (t)]}{2},

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ψ (t, ν) = \arctan {\frac{[s_{12} (t) - s_{20}] A_{1}}{[s_{11} (t) - s_{10}] A_{2}}} .

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f_{e} = \frac{slope [ψ (t, ν)]}{2 π ν},

(8)

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slope [ψ (t, ν)] = \frac{\frac{1}{N} \sum_{i = 1}^{N} t_{i} ψ_{i} - \frac{1}{N} \sum_{i = 1}^{N} t_{i} \times \frac{1}{N} \sum_{i = 1}^{N} ψ_{i}}{\frac{1}{N} \sum_{i = 1}^{N} t_{i}^{2} - {(\frac{1}{N} \sum_{i = 1}^{N} t_{i})}^{2}},

(9)

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L_{e} (f_{m}) = \frac{S_{φ s} (f_{m})}{2} = \frac{{[φ_{s} (t) - φ_{s} (t - τ)]}_{psd}}{2 {| 1 - e^{- j π f_{m} τ} |}^{2}} = \frac{S_{ψ} (f_{m})}{8 \sin^{2} (π f_{m} τ)}, f_{m} \neq 0,

(10)

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Jingzhan Shi, Fangzheng Zhang, De Ben, Shilong Pan, "Photonic-assisted single system for microwave frequency and phase noise measurement," Chin. Opt. Lett. 18, 092501 (2020)

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