Photonic-assisted single system for microwave frequency and phase noise measurement

Jingzhan Shi; Fangzheng Zhang; De Ben; Shilong Pan

doi:10.3788/COL202018.092501

Journals >Chinese Optics Letters >Volume 18 >Issue 9 >Page 092501 > Article

Chinese Optics Letters
Vol. 18, Issue 9, 092501 (2020)

Photonic-assisted single system for microwave frequency and phase noise measurement | Editors' Pick

Jingzhan Shi, Fangzheng Zhang^*, De Ben, and Shilong Pan

Author Affiliations

Key Laboratory of Radar Imaging and Microwave Photonics, Ministry of Education, Nanjing University of Aeronautics and Astronautics, Nanjing 210016, China

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DOI: 10.3788/COL202018.092501 Cite this Article Set citation alerts

Jingzhan Shi, Fangzheng Zhang, De Ben, Shilong Pan. Photonic-assisted single system for microwave frequency and phase noise measurement[J]. Chinese Optics Letters, 2020, 18(9): 092501 Copy Citation Text

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Jingzhan Shi, Fangzheng Zhang, De Ben, Shilong Pan. Photonic-assisted single system for microwave frequency and phase noise measurement[J]. Chinese Optics Letters, 2020, 18(9): 092501

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