• Opto-Electronic Engineering
  • Vol. 34, Issue 4, 73 (2007)
[in Chinese]1、2, [in Chinese]1, and [in Chinese]1
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  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: Cite this Article
    [in Chinese], [in Chinese], [in Chinese]. Phase analysis based on complex Morlet wavelet[J]. Opto-Electronic Engineering, 2007, 34(4): 73 Copy Citation Text show less
    References

    [1] Mitsuo TAKEDA,Kazuhiro MUTOH.Fourier transform profilometry for the automatic measurement 3-D object shapes[J].Applied Optics,1983,22(24):3977-3982.

    [2] SU Xian-yu,CHEN Wen-jing.Fourier transform profilometry:a review[J].Optics and Laser Engineering,2001,35(5):263-284.

    [3] Xian-yu SU,yon BALLY G,VUKICEVIC D.Phase-stepping grating profilometry:utilization of intensity modulation analysis in complex objects evaluation[J].Opt Commun,1993,98(1-3):141-150.

    [4] Sajan MR,Tay CJ,Shang HM,et al.Improved spatial phase detection for profilometry using a TDI imager[J].Opt Commun,1998,150(1-6):66-70.

    [5] Likun SU,Xianyu SU,Wangsong LI,et al.Application of modulation measurement profilometry to objects with surface holes[J].Applied Optics,1999,38(7):1153-1158.

    [7] M.AFIFI,A.FASSI-FIHRI,M.MARJANE,et al.Paul wavelet-based algorithm for optical phase distribution evaluation[J].Optics Communications,2002,211(1-6):47-51.

    [8] Cho Jui TAY,Chenggen QUAN,Yu FU,et al.Instantaneous velocity displacement and contour measurement by use of shadow moire and temporal wavelet analysis[J].Appl.Opt,2004,43(21):4164-4171.

    CLP Journals

    [1] Li Jianxin, Cui Yanjun, Zhu Rihong, He Yong. Micro-Displacement Variation Measurement by Using Laser Interference Based on Wavelet Transform[J]. Chinese Journal of Lasers, 2012, 39(8): 808002

    [2] Xu Feng, Hu Song, Zhou Shaolin, Xu Wenxiang. Interference Fringe Pattern Phase Analysis in Alignment of Nanolithography[J]. Acta Optica Sinica, 2012, 32(2): 212001

    [in Chinese], [in Chinese], [in Chinese]. Phase analysis based on complex Morlet wavelet[J]. Opto-Electronic Engineering, 2007, 34(4): 73
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