• Acta Optica Sinica
  • Vol. 37, Issue 11, 1112002 (2017)
Bin Zheng1、3、4, Peifen Lu2, Yonghe Chen1、3, and Yutian Fu1、3、*
Author Affiliations
  • 1 Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China
  • 2 State Key Laboratory of Precision Spectroscopy, East China Normal University, Shanghai 200062, China
  • 3 Key Laboratory of Infrared Detecting and Imaging Technology, Chinese Academy of Sciences, Shanghai 200083, China
  • 4 University of Chinese Academy of Sciences, Beijing 100049, China
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    DOI: 10.3788/AOS201737.1112002 Cite this Article Set citation alerts
    Bin Zheng, Peifen Lu, Yonghe Chen, Yutian Fu. Co-Phase Error Detection of Segmented Mirrors[J]. Acta Optica Sinica, 2017, 37(11): 1112002 Copy Citation Text show less
    Optical path of the segmented mirror co-phase detection system
    Fig. 1. Optical path of the segmented mirror co-phase detection system
    (a) Schematic of the mask plate; (b) alignment schematic of mask plate and segmented mirrors; (c) prism array
    Fig. 2. (a) Schematic of the mask plate; (b) alignment schematic of mask plate and segmented mirrors; (c) prism array
    Eleven diffraction template patterns. (a) -5λ/20; (b) -4λ/20; (c) -3λ/20; (d) -2λ/20; (e) -λ/20; (f) 0; (g) λ/20; (h) 2λ/20; (i) 3λ/20; (j) 4λ/20; (k) 5λ/20
    Fig. 3. Eleven diffraction template patterns. (a) -5λ/20; (b) -4λ/20; (c) -3λ/20; (d) -2λ/20; (e) -λ/20; (f) 0; (g) λ/20; (h) 2λ/20; (i) 3λ/20; (j) 4λ/20; (k) 5λ/20
    Contour maps of every template pattern in Fig. 3. (a) -5λ/20; (b) -4λ/20; (c) -3λ/20; (d) -2λ/20; (e) -λ/20; (f) 0; (g) λ/20; (h) 2λ/20; (i) 3λ/20; (j) 4λ/20; (k) 5λ/20
    Fig. 4. Contour maps of every template pattern in Fig. 3. (a) -5λ/20; (b) -4λ/20; (c) -3λ/20; (d) -2λ/20; (e) -λ/20; (f) 0; (g) λ/20; (h) 2λ/20; (i) 3λ/20; (j) 4λ/20; (k) 5λ/20
    (a) Phase plate; (b) double semicircle diffraction mask plate; (c) double semicircle diffraction mask plate with only one hole
    Fig. 5. (a) Phase plate; (b) double semicircle diffraction mask plate; (c) double semicircle diffraction mask plate with only one hole
    Diffraction patters corresponding to four phase differences with the wavelength of 635 nm. (a) 229 nm; (b) 458 nm; (c) 687 nm; (d) -1374 nm
    Fig. 6. Diffraction patters corresponding to four phase differences with the wavelength of 635 nm. (a) 229 nm; (b) 458 nm; (c) 687 nm; (d) -1374 nm
    Diffraction patters corresponding to four phase differences with the wavelength of 650 nm. (a) 229 nm; (b) 458 nm; (c) 687 nm; (d) -1374 nm
    Fig. 7. Diffraction patters corresponding to four phase differences with the wavelength of 650 nm. (a) 229 nm; (b) 458 nm; (c) 687 nm; (d) -1374 nm
    Half wavelength periodOptical path difference
    0.36λ0.72λ1.08λ-2.16λ
    -5λ/200.7590.8710.4900.845
    -4λ/200.8950.8580.4780.856
    -3λ/200.8810.8370.4750.873
    -2λ/200.8420.8030.8360.831
    -λ/200.6580.3880.8410.418
    00.4700.3640.8430.489
    λ/200.4390.3500.8510.471
    2λ/200.5010.3430.8440.761
    3λ/200.6550.7720.4740.796
    4λ/200.7370.8870.4810.824
    5λ/200.7590.8710.4900.845
    Table 1. Correlation matching results of the four situations when the wavelength is 635 nm
    Half wavelength periodOptical path difference
    0.35λ0.70λ1.06λ-2.11λ
    -5λ/200.8670.7120.4300.448
    -4λ/200.8790.7210.6060.788
    -3λ/200.8930.6800.6670.880
    -2λ/200.7900.4810.7670.890
    -λ/200.3950.3270.8620.762
    00.4090.3320.8700.460
    λ/200.4230.3280.8840.457
    2λ/200.4140.5280.8520.705
    3λ/200.4080.6070.8260.737
    4λ/200.7860.7790.6090.629
    5λ/200.8670.7120.4300.448
    Table 2. Correlation matching results of the four situations when the wavelength is 650 nm
    ParameterOptical path difference
    229 nm458 nm687 nm-1347 nm
    z1-4λ1/204λ1/20λ1/20-3λ1/20
    z2-3λ2/204λ2/20λ2/20-2λ2/20
    m112-4
    n112-4
    h1 /nm190.5444.5666.75-1365.25
    h2 /nm227455682.5-1365
    Error value of h1 /nm-38.513.5-20.2518.25
    Error value of h2 /nm-2-3-4.518
    Table 3. Results of the two wavelength narrow band co-phase algorithm with λ1=635 nm, λ2=650 nm
    Bin Zheng, Peifen Lu, Yonghe Chen, Yutian Fu. Co-Phase Error Detection of Segmented Mirrors[J]. Acta Optica Sinica, 2017, 37(11): 1112002
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