• Chinese Journal of Quantum Electronics
  • Vol. 25, Issue 4, 489 (2008)
Tie LI*, Hang-yu WANG, and Hong-jun WANG
Author Affiliations
  • [in Chinese]
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    DOI: Cite this Article
    LI Tie, WANG Hang-yu, WANG Hong-jun. Application of genetic simulated annealing algorithm in BRDF statistical modelling[J]. Chinese Journal of Quantum Electronics, 2008, 25(4): 489 Copy Citation Text show less
    References

    [1] Gibbs D P,Betty C L,Fung A K,et al. Automated measurement of polarized bidirectional reflectance [J].Remote Sense Environ.,1993,43(2): 97-114.

    [2] Marschner S R,Westin S H,Lafortune E P F,et al. Image-based BRDF measurement including human skin [C].in 10th Eurographics Workshop on Rendering,1999,139-152.

    [4] Kirkpatrick S,Gelatt C D,Vecchi N P. Optimization by simulated annealing [J].Science,1983,220: 671-680.

    [5] Torrance K,Sparrow E. Theory or off-specular reflection from roughened surfaces [J].J. Opt. Soc. America,1967,57(9): 1105-1115.

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    LI Tie, WANG Hang-yu, WANG Hong-jun. Application of genetic simulated annealing algorithm in BRDF statistical modelling[J]. Chinese Journal of Quantum Electronics, 2008, 25(4): 489
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