• Acta Optica Sinica
  • Vol. 19, Issue 5, 640 (1999)
[in Chinese]1, [in Chinese]1, [in Chinese]1, [in Chinese]1, [in Chinese]1, [in Chinese]1, and [in Chinese]2
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Effect of Lithium-Intercalation on Optical Absorption of Vanadium Pentoxide Thin Films[J]. Acta Optica Sinica, 1999, 19(5): 640 Copy Citation Text show less
    References

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    [16] Aita C R, Kao M L. Low-temperature oxidation of nonstoichimetric sputter depositd vanadium pentoxide. J. Vac. Sci. Technol., 1987, A5(4):2714~2717

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    [20] Pecquenard B, Gourier D, Caurant D. Electron nuclear double resonance of polarons in α-Lix V2O5. J. Phys. Chem., 1996, 100(21):9152~9160

    [21] Badot J C, Gourier D, Bourdeau F et al.. Electronics properties of Na0.33V2O5 bronze obtained by the sol-gel process. J. Solid State Chem., 1991, 92(1):8~17

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    CLP Journals

    [1] Wu Xiaochun, Lai Fachun, Lin Limei, Lin Lianghui, Qu Yan. Influence of Thickness on the Structural and Optical Properties of Vanadium Oxide Thin Films[J]. Chinese Journal of Lasers, 2008, 35(s2): 311

    [2] Zhang Shengbin, Zuo Dunwen, Lu Wenzhuang, Zuo Yangping. Optical and Electrical Properties of Vanadium Pentoxide Films Deposited on Different Substrates[J]. Acta Optica Sinica, 2016, 36(4): 431001

    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Effect of Lithium-Intercalation on Optical Absorption of Vanadium Pentoxide Thin Films[J]. Acta Optica Sinica, 1999, 19(5): 640
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