• Opto-Electronic Engineering
  • Vol. 43, Issue 11, 1 (2016)
CUI Hao1、2, LI Bincheng1、2, HAN Yanling1, GAO Chunming2, and WANG Yafei2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: 10.3969/j.issn.1003-501x.2016.11.001 Cite this Article
    CUI Hao, LI Bincheng, HAN Yanling, GAO Chunming, WANG Yafei. Error Analysis of the Loss Measurement of Super High Reflectivity Components Using Continuous CRD Technique[J]. Opto-Electronic Engineering, 2016, 43(11): 1 Copy Citation Text show less
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    CUI Hao, LI Bincheng, HAN Yanling, GAO Chunming, WANG Yafei. Error Analysis of the Loss Measurement of Super High Reflectivity Components Using Continuous CRD Technique[J]. Opto-Electronic Engineering, 2016, 43(11): 1
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