Threshold current extraction method based on wavelet transform for laser diode LIV testing

Ming-wei YANG; Yuan-hong YANG

Journals >Chinese Journal of Quantum Electronics >Volume 28 >Issue 3 >Page 282 > Article

Chinese Journal of Quantum Electronics
Vol. 28, Issue 3, 282 (2011)

Threshold current extraction method based on wavelet transform for laser diode LIV testing

Ming-wei YANG^* and Yuan-hong YANG

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[in Chinese]

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DOI: Cite this Article

YANG Ming-wei, YANG Yuan-hong. Threshold current extraction method based on wavelet transform for laser diode LIV testing[J]. Chinese Journal of Quantum Electronics, 2011, 28(3): 282 Copy Citation Text

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References

[2] Chen Jiewei, Jerry Z, James C. Diode laser bonding of planar MEMS, MOEMS, and microfluidic devices [C]. Proceeding of Materials Research Society Spring Meeting, San Francisco, United States, 2005: 309-314.

[3] Dirk Mittnacht, Albert Linder, Hans-Jochen Foth. Medical application of a high power diode laser [C]. Proceeding of SPIE on Progress in Biomedical Optics and Imaging, Munich, Germany, 2005: 14-15.

[4] Hohl-AbiChedid A, Rice A, Li J, et al. High power and high efficiency single mode AlGaInAs/InP 14xx laser with high temperature operation [C]. Topical Meeting on Optical Amplifiers and Their Applications, Vancouver, Canada, 2002: 185-187.

[5] Cornelius P. Laser-diode test instrumentation gets smarter [J]. Laser Focus World, 2005, 41(5): 153-155.

YANG Ming-wei, YANG Yuan-hong. Threshold current extraction method based on wavelet transform for laser diode LIV testing[J]. Chinese Journal of Quantum Electronics, 2011, 28(3): 282

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