[1] D. E. Aspnes. Optical Properties of Solids, New Developments, edited by B. O. Seraphin, Amsterdam: North-Holland Publishing Company, 1975: Chap. 15
[2] Gary E. Sommargren. Optical heterodyne profilometry. Appl. Opt., 1981, 20(3): 610~617
[3] J. M. Bennett, J. H. Dancy. Stylus profiling instrument for measuring statistical properties of smooth optical surfaces. Appl. Opt., 1981, 20(6): 1785~1791
[4] H. E. Bennett. Scattering characteristics of optical materials. Opt. Engng., 1978, 17(3): 480~489
[5] E. Fontana, R. H. Pantell. Characterization of multilayer rough surfaces by use of surface-plasmon spectroscopy. Phys. Rev. (B), 1988, 37(7): 3164~3181
[6] A. Otto. Optical Properties of Solids. New Developments, edited by B. O. Seraphin, Amsterdam: North-Holland Publishing Company, 1975. Chap. 13
[7] D. N. Mirlin. Surface Polaritons, edit by V. M. Agranovich, D. L. Mill, Amsterdam, North-Holland Publishing Company, 1982. Chap. 1
[8] H. Raether. Surface Polaritions, edit by V. M. Agranovich, D. L. Mill, Amsterdam, North-Holland Publishing Company, 1982. Chap. 9
[9] H. Raether. Surface plasmon oscillations and their applications. Physics of Thin Films, 1977, 9(2): 145~151
[10] R. Orlowski, P. Urner, D. L. Hornauer. Influence of various underlayers on the surface roughness of evaporated silver films. Surf. Sci., 1979, 82(1): 69~78
[11] H. Tajima, M. Haraguchi, M. Fukui. Surface plasmon polariation from silver films on fluoride films and surface roughness parameters of those films. Surf. Sci., 1995, 323(2): 282~287
[12] F. Varnier, N. Mayani, G. Rasigi. Surface roughness and fractal nature of thin films of MgF2 and Ag/MgF2. J.V ac. Sci. Technol. (A), 1989, 7(3): 1289~1293
[13] E. Kroger, E. Kretschmann. Scattering of light by slightly rough surfaces or thin films including plasma resonance emission. Z. Physik, 1970, 237(1): 1~15
[14] O. Kienzle, J. Staub, T. Tschudi. Light scattering from transparent substrates: Theory and experiment. Phys. Rrev. (B), 1994, 50(3): 1848~1860
[15] Yoshiki Naoi, Masuo Fukui. Evaluation of surface roughness parametersof metal films by light scattering technique. J. Phys. Soc. Jpn., 1989, 58(12): 4511~4516
[16] P. Bousquet, F. Flory, P. Roche. Scattering from multilayer thin films: Theory and experiment. J. Opt. Soc. Am, 1981, 71(9): 1115~1123
[17] D. G. Hall, A. J. Braundmeier, Jr.. Angular dependence of roughness-assisted surface plasmon radiation: Comparison of theory and experiments. Phys. Rev. (B), 1978, 17(4): 1557~1562
[18] H. Ogura, Z. L. Wang. Surface-plsmon mode on a random metal surface: Enhanced backscattering and localization. Phys. Rev. (B), 1996, 53(15): 10358~10370
[19] J. M. Elson. Infrared light scattering from surface covered with multiple dielectric overlayers. Appl. Opt., 1977, 16(11): 2872~2881
[20] Fu Hillebrecht. Determination of surface roughness from scattered light measurements. J. Phys. (D): Appl. Phys., 1980, 13(9): 1625~1631