High Resolution Test Technology for High-current Pulse Electron Beam

[in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]

Journals >Acta Photonica Sinica >Volume 34 >Issue 6 >Page 939 > Article

Acta Photonica Sinica
Vol. 34, Issue 6, 939 (2005)

High Resolution Test Technology for High-current Pulse Electron Beam

[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], and [in Chinese]

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[in Chinese]

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[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. High Resolution Test Technology for High-current Pulse Electron Beam[J]. Acta Photonica Sinica, 2005, 34(6): 939 Copy Citation Text

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References

[1] Turner W C. Reduction of the beam corkscrew motion on the ETA-Ⅱ LIA. Proc. 1990 Linac Conf. Albuquerque, NM, Sept,10-14, 1990. 435～437

[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. High Resolution Test Technology for High-current Pulse Electron Beam[J]. Acta Photonica Sinica, 2005, 34(6): 939

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