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    Journals >Acta Photonica Sinica >Volume 34 >Issue 6 >Page 939 > Article
    • Acta Photonica Sinica
    • Vol. 34, Issue 6, 939 (2005)
    High Resolution Test Technology for High-current Pulse Electron Beam
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. High Resolution Test Technology for High-current Pulse Electron Beam[J]. Acta Photonica Sinica, 2005, 34(6): 939 Copy Citation Text show less
    References

    [1] Turner W C. Reduction of the beam corkscrew motion on the ETA-Ⅱ LIA. Proc. 1990 Linac Conf. Albuquerque, NM, Sept,10-14, 1990. 435～437

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. High Resolution Test Technology for High-current Pulse Electron Beam[J]. Acta Photonica Sinica, 2005, 34(6): 939
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