• Chinese Journal of Quantum Electronics
  • Vol. 24, Issue 6, 714 (2007)
Yun-zhi WU, Qing-nong WEI*, Shi-mei WANG, and Wei-wei FENG
Author Affiliations
  • [in Chinese]
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    DOI: Cite this Article
    WU Yun-zhi, WEI Qing-nong, WANG Shi-mei, FENG Wei-wei. Measurement of material surface's Mueller matrix by Fourier decomposition[J]. Chinese Journal of Quantum Electronics, 2007, 24(6): 714 Copy Citation Text show less
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    [7] Krishnan S. Mueller matrix ellipsometry using the division-of-amplitude photopolarimeter:a study of depolarization effects [J].Appl. Opt. A,1994,33: 4184-4192.

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    [10] Lianhua Jin. Mueller matrix polarimeter in 157 nm [C].SPIE.,2003,5188: 146-153.

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    WU Yun-zhi, WEI Qing-nong, WANG Shi-mei, FENG Wei-wei. Measurement of material surface's Mueller matrix by Fourier decomposition[J]. Chinese Journal of Quantum Electronics, 2007, 24(6): 714
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