• Opto-Electronic Engineering
  • Vol. 39, Issue 3, 144 (2012)
ZOU Xiao-lin1、2、3、* and FENG Guo-can2、3
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    DOI: 10.3969/j.issn.1003-501x.2012.03.025 Cite this Article
    ZOU Xiao-lin, FENG Guo-can. Image Thresholding Segmentation Based on 2D-WLDH and Maximum between-cluster Variance and Its Fast Recursive Algorithm[J]. Opto-Electronic Engineering, 2012, 39(3): 144 Copy Citation Text show less
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    [2] XU Xiang-yang,SONG En-min,JIN Liang-hai. Characteristic Analysis of Threshold Based on Otsu Criterion [J]. Acta Electronics Sinica,2009,37(12):2716-2719.

    [3] ZhANG Xin-ming,DANG Liu-qun,ZHENG Yan-bin,et al. Improved Image Segmentation Based on 2-D Minimum Cross Entropy [J]. Opto-Electronic Engineering,2010,37(11):103-109.

    [4] LING Guang-ming,LIU Dong-hua,LI Bo,et al. Improvement of Two-Dimension Adaptive Thresholding Segmentation Algorithm for Microscopic Cellular Images [J]. Journal of Image and Graphics,2003,8(7):764-768.

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    [6] HUANG D,WANG C. Optimal Multi-Level Thresholding Using a Two-Stage Otsu Optimization Approach [J]. Pattern Recognition Letters (S0167-8655),2009,30:275-284.

    [7] LIU Jian-zhuang,LI Wen-qing. Automatic Thresholding of Gray-Level Pictures Using Two-Dimensional Otsu Method [J].Acta Automatic Sinica,1993,19(1):101-105.

    [8] WANG Hai-yang,PAN De-lu,XIA De-shen. A Fast Algorithm for Two-Dimensional Otsu Adaptive Threshold Algorithm [J].Acta Automatic Sinica,2007,33(9):968-970.

    [9] WU Yi-quan,ZHANG Jin-kuang. Thresholding Based on Maximum Entropic Correlation of Average Gray Level-Gradient Two-Dimensional Histogram [J]. Journal of Chinese Computer Systems,2009,30(8):1675-1679.

    [10] JAIN A K. Fundamentals of Digital Image Processing [M]. Prentice Hall,1989:51.

    [11] CHEN J,SHANG S G,HE C,et al. WLD:A Robust Local Image Descriptor [J]. IEEE Transactions on Pattern Analysis and Machine Intelligence(S0162-8828),2010,32(9):1705–1720.

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    ZOU Xiao-lin, FENG Guo-can. Image Thresholding Segmentation Based on 2D-WLDH and Maximum between-cluster Variance and Its Fast Recursive Algorithm[J]. Opto-Electronic Engineering, 2012, 39(3): 144
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