• Acta Optica Sinica
  • Vol. 22, Issue 2, 249 (2002)
[in Chinese]1、*, [in Chinese]1, [in Chinese]1, [in Chinese]1, [in Chinese]2, [in Chinese]2, [in Chinese]2, and [in Chinese]2
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Dynamic Argument Using Shift Phase Interferometry[J]. Acta Optica Sinica, 2002, 22(2): 249 Copy Citation Text show less
    References

    [3] Andrew Lewis. Measurement of length, surface form and thermal expansion coefficient for length bars up to 1.5 m using multiple wavelength phase stepping interferometry. Meas. Sci. Technol., 1994, 5(6):694~703

    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Dynamic Argument Using Shift Phase Interferometry[J]. Acta Optica Sinica, 2002, 22(2): 249
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