• Journal of Infrared and Millimeter Waves
  • Vol. 23, Issue 4, 262 (2004)
[in Chinese]1、2, [in Chinese]1, and [in Chinese]2
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  • 1[in Chinese]
  • 2[in Chinese]
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    [in Chinese], [in Chinese], [in Chinese]. STUDY ON REFRACTIVE INDEX OF GaN BY SPECTROSCOPIC ELLIPSOMETRY[J]. Journal of Infrared and Millimeter Waves, 2004, 23(4): 262 Copy Citation Text show less
    References

    [1] Monemar B, Ⅲ-Ⅴ Nitrides-Important future electronic materials[J]. Journal of Materials Science: Materials in Electronics, 1999, 10: 227-254.

    [2] Razeghi M, Rogalski A. Semiconductor ultraviolet detectors[J]. J.Appl.Phys., 1996, 79(10): 7433-7473.

    [3] Shokhovets S, Goldhahn R, Cimalla V, et al. Peflectivity study of hexagonal GaN films grown on GaAs: Surface rough, interface layer and refractive index[J]. J.Appl.Phys., 1998, 84(3): 1561-1566.

    [4] Tao Yang, Shigeo Goto, Masahiko Kawata. et al. Optical properties of GaN thin films on sapphire substrates characterized by variable-angle spectroscopic ellipsometry[J]. Jpn.J.Appl.Phys, 1998, 37: L1105-1108.

    [5] Yu G, Wang G, Ishikawa H, et al. Optical properties of wurzite structure GaN on sapphire around fundamental absorption edge(0.78-4.77eV) by spectroscopic ellipsometry and the optical transmission method[J]. Appl.Phys.Letter, 1997, 70(24): 3209-3211.

    [6] Yu G, Isiikawa H, Egawa T, et al. Polarized reflectance spectroscopy and spectroscopic ellipsometry determination of the optical anisotropy of gallium nitride on sapphire[J]. Jpn.J.Appl.Phys, 1997, 36: L1029-1031.

    [7] Muth J F, Brown J D, Johnson M A L, et al. Absorption coefficient and refractive index of GaN, AIN and AlGaN Alloys[J]. MRS Internet J. Nitride Semicond.Res, 1999, 4S1,G5.2.

    [9] Azzam R M A, Bashara N M. Ellipsometry and Polarized Light[M]. North-Holland:Amsterdam, 1977, 283-288.

    [10] Palik E D. Handbook of Optical Constants of Solids[M]. Orlando Academic, F1,1985.

    [11] Takahiro Kawashima, Hisashi Yoshikawa, Sadao Adachi, et al. Optical properties of hexagonal GaN[J]. J.Appl.Phys., 1997, 82(7): 3528-3535.

    [in Chinese], [in Chinese], [in Chinese]. STUDY ON REFRACTIVE INDEX OF GaN BY SPECTROSCOPIC ELLIPSOMETRY[J]. Journal of Infrared and Millimeter Waves, 2004, 23(4): 262
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