[1] SUN Yuchen, GE Baozhen, ZHANG Yimo. Review for the 3D Information Measuring Technology [J]. Journal of Optoelectronics. Laser, 2004, 15(2):248-254.
[2] ZHANG Qican, SU Xianyu. Research progress of dynamic three-dimensional shape measurement [J]. Laser & Optoelectronics Progress, 2013, 50:010001.
[3] GUO Guangping, JI Xinhua, QIN Yuwen, et al. Mach-Zehnder heterodyne interferometer for high-precision displacement measurement [J]. Optical Technology, 1997(6):19-22.
[5] Sasaki, Okazaki H. Sinusoidal phase modulating interferometry for surface profile measurement [J]. Applied Optics (S1559-128X), 1986, 25:3137-3140.
[6] Suzuki T, Sasaki O, Higuchi K, et al. Real time displacement measurement in sinusoidal phase modulating interferometry [J]. Applied Optics(S1559-128X), 1989, 28(24):5270-5274.
[7] Heinzel G, Cervantes F G, Marín A G, et al. Deep phase modulation interferometry [J]. Optics Express (S1094-4087), 2010, 18(18):19076-19086.
[9] Sasaki, Okazaki H, Sakai M. Sinusoidal phase modulating interferometer using the integrating-bucket method [J]. Applied Optics(S1559-128X), 1987, 26(6):1089-1093.
[10] BO En, DUAN Fajie, Lü Changrong, et al. The alternating current phase tracking homodyne compensation method and its implementation using CORDIC [J]. Chinese Journal of Sensor and Actuators, 2014, 27(2):1-6.
[11] SHI Qingping, WANG Liwei, ZHANG Min, et al. Frequency-modulated phase generated carrier demodulation for eliminating companion amplitude modulation [J]. Journal of Optoelectronics. Laser, 2011, 22(2):180-184.
[12] Meher P K, Valls J, Juang Tso-Bing, et al. 50 Years of CORDIC:Algorithms, Architectures, and Applications [J]. IEEE Transactions on Circuits and Systems I:Regular Papers(S1549-8328), 2009, 56(9):1893-1907.
[13] Dubois A. Phase-map measurements by interferometry with sinusoidal phase modulation and four integrating buckets [J]. The Journal of the Optical Society of America A(S1084-7529), 2001, 18(8):1972-1979.
[14] Freschi A A, Frejlich J. Adjustable phase control in stabilized interferometry [J]. Optics Letters(S0146-9592), 1995, 20(6): 635-637.