• Laser & Optoelectronics Progress
  • Vol. 55, Issue 4, 041301 (2018)
Huaming Wu1、2、*, Wenbo Xiao1、2, Yongsheng Xiao1, Lizhen Huang1, Junhong Duan1、2, Huanhuan Xu1、2, Xianshuang Liu1、2, and Jianping Fu1、2
Author Affiliations
  • 1 National Engineering Laboratory for Non-Destructive Testing and Optoelectronic Sensing Technology and Applications, Key Laboratory of Non-Destructive Testing, Ministry of Education, Nanchang, Jiangxi 330063, China
  • 1 School of Information Engineering, Nanchang Hangkong University, Nanchang, Jiangxi 330063, China
  • 2 Jiangxi Engineering Laboratory for Optoelectronics Testing Technology, School of Measuring and Optical Engineering, Nanchang Hangkong University, Nanchang, Jiangxi 330063, China
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    DOI: 10.3788/LOP55.041301 Cite this Article Set citation alerts
    Huaming Wu, Wenbo Xiao, Yongsheng Xiao, Lizhen Huang, Junhong Duan, Huanhuan Xu, Xianshuang Liu, Jianping Fu. Parameters Analysis of Polarization Independent Reflector with Multi-Subpart Profile Resonant Grating[J]. Laser & Optoelectronics Progress, 2018, 55(4): 041301 Copy Citation Text show less
    Schematic of a multilayered polarization independent grating reflector under normal incidence with TE and TM polarized waves
    Fig. 1. Schematic of a multilayered polarization independent grating reflector under normal incidence with TE and TM polarized waves
    SEM image and reflectance spectra of the reflector normally illuminated by both TE and TM polarized waves
    Fig. 2. SEM image and reflectance spectra of the reflector normally illuminated by both TE and TM polarized waves
    Influence of the variation of grating period on the reflectance spectrum of the device. (a) TE polarized light; (b) TM polarized light
    Fig. 3. Influence of the variation of grating period on the reflectance spectrum of the device. (a) TE polarized light; (b) TM polarized light
    Influence of the variation of grating thickness on the reflectance spectrum of the device. (a) TE polarized light; (b) TM polarized light
    Fig. 4. Influence of the variation of grating thickness on the reflectance spectrum of the device. (a) TE polarized light; (b) TM polarized light
    Influence of the variation of (a) x1, (b) x3 and (c) x5 on the reflectance spectrum of the device under TE light illumination
    Fig. 5. Influence of the variation of (a) x1, (b) x3 and (c) x5 on the reflectance spectrum of the device under TE light illumination
    Influence of the variation of (a) x1, (b) x3 and (c) x5 on the reflectance spectrum of the device under TM polarized light
    Fig. 6. Influence of the variation of (a) x1, (b) x3 and (c) x5 on the reflectance spectrum of the device under TM polarized light
    Influence of the variation of tm on the reflectance spectrum of the device. (a) TE polarized light; (b) TM light illumination
    Fig. 7. Influence of the variation of tm on the reflectance spectrum of the device. (a) TE polarized light; (b) TM light illumination
    Influence of the variation of tb on the reflectance spectrum of the device. (a) TE polarized light; (b) TM polarized light
    Fig. 8. Influence of the variation of tb on the reflectance spectrum of the device. (a) TE polarized light; (b) TM polarized light
    Huaming Wu, Wenbo Xiao, Yongsheng Xiao, Lizhen Huang, Junhong Duan, Huanhuan Xu, Xianshuang Liu, Jianping Fu. Parameters Analysis of Polarization Independent Reflector with Multi-Subpart Profile Resonant Grating[J]. Laser & Optoelectronics Progress, 2018, 55(4): 041301
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