A speckle pattern defletometry (SPD) based on digital image correlation (DIC) is proposed. The two-dimensional DIC is used to measure the three-dimensional shape of a specular surface. The displacements of speckle patterns instead of the deformations of fringes are used to make the deflectometry measurement process simpler and more efficient. Only two speckle patterns need to be taken and the measurement accuracy of surface can reach micrometer level. The principle and method of SPD are described. The relevant formulas are derived, and the design and production of a speckle pattern are involved. An acrylic plastic plate is measured in the experiment. Compared with the experimental results of the phase measuring deflectometry, the measurement accuracy of nearly 1 μm is achieved.