• Infrared and Laser Engineering
  • Vol. 46, Issue 11, 1125005 (2017)
Fan Changkun*, Li Qi, Zhao Yongpeng, and Chen Deying
Author Affiliations
  • [in Chinese]
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    DOI: 10.3788/irla201746.1125005 Cite this Article
    Fan Changkun, Li Qi, Zhao Yongpeng, Chen Deying. Measurement of 2.52 THz back scattering in different roughness paraboloid[J]. Infrared and Laser Engineering, 2017, 46(11): 1125005 Copy Citation Text show less
    References

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    [9] Hua Houqiang, Jiang Yuesong, Su Lin, et al. High-frequency analysis on THz RCS of complex conductive targets in free space[J]. Infrared and Laser Engineering, 2014, 43(3): 687-693. (in Chinese)

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    [13] Fan Changkun, Li Qi, Zhao Yongpeng, et al. Measurement of 2.52 terahertz back scattering in aluminium plates with four kinds of roughness[J]. Laser & Optoelectronics Progress, 2016, 53(11): 111201. (in Chinese)

    [14] Fan Changkun, Li Qi, Zhou Yi, et al. Controlling software development of CW terahertz target scattering properties measurements based on LabVIEW[C]//Proceedings of the International Symposium on Optoelectronic Technology and Application(OTA16), 2016.

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    CLP Journals

    [1] Xiuwei Yang, Dehai Zhang, Zhongjun Xiao, Xiangdong Li, Lin Zhang. Effect of surface roughness on THz reflection measurement[J]. Infrared and Laser Engineering, 2021, 50(3): 20200209

    Fan Changkun, Li Qi, Zhao Yongpeng, Chen Deying. Measurement of 2.52 THz back scattering in different roughness paraboloid[J]. Infrared and Laser Engineering, 2017, 46(11): 1125005
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