• Chinese Journal of Lasers
  • Vol. 41, Issue 11, 1102004 (2014)
Dai Yin*, Li Lin, Yuan Huibo, Qiao Zhongliang, Gu Lei, Liu Yang, Li Te, and Qu Yi
Author Affiliations
  • [in Chinese]
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    DOI: 10.3788/cjl201441.1102004 Cite this Article Set citation alerts
    Dai Yin, Li Lin, Yuan Huibo, Qiao Zhongliang, Gu Lei, Liu Yang, Li Te, Qu Yi. Study on Simulation of the Small Far Field Divergence Semiconductor Lasers with Mode Expansion Layers[J]. Chinese Journal of Lasers, 2014, 41(11): 1102004 Copy Citation Text show less

    Abstract

    The impact of center waveguide layers, mode expansion layers and confinement layers on semiconductor laser performance with mode expansion layers has been investigated using the crosslight software. A structure with stripe width of 50 μm and far field divergence angle of 23° is obtained, whose threshold current is 117.8 mA and confinement factor is 2.37%. The far field divergence angle can be as low as 18° when the threshold current is 200.9 mA. After optimization the far field vertical divergence angle is reduced by about 20° without obvious threshold current increas. The results show that the mode expansion layers do not reduce the electrical properties and the temperature stability characteristics of lasers.
    Dai Yin, Li Lin, Yuan Huibo, Qiao Zhongliang, Gu Lei, Liu Yang, Li Te, Qu Yi. Study on Simulation of the Small Far Field Divergence Semiconductor Lasers with Mode Expansion Layers[J]. Chinese Journal of Lasers, 2014, 41(11): 1102004
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