• Optoelectronics Letters
  • Vol. 19, Issue 1, 55 (2023)
Liang XU1、*, Shiwei ZHAO1, Wei XUE2, and Tao and WANG3
Author Affiliations
  • 1Tianjin Key Laboratory for Control Theory & Applications in Complicated Systems, School of Electrical Engineering and Automation, Tianjin University of Technology, Tianjin 300384, China
  • 2China Academy of Aerospace Science and Innovation, Beijing 100083, China
  • 3School of Intelligent Engineering, Sun Yat-sen University, Guangzhou 510275, China
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    DOI: 10.1007/s11801-023-2046-9 Cite this Article
    XU Liang, ZHAO Shiwei, XUE Wei, and WANG Tao. Computation and analysis of aero-optic imaging deviation of a blunt nosed aircraft with Mach number 0.5-3[J]. Optoelectronics Letters, 2023, 19(1): 55 Copy Citation Text show less

    Abstract

    Aero-optic imaging is a kind of optical effect, which describes the imaging deviation on the imaging plane. In this paper, the effect of the change of Mach number of blunt aircraft on the aero-optic imaging deviation is studied. The imaging deviations of Mach number 0.5-3 are analyzed systematically. The results show that with the increase of Mach number, imaging deviation increases gradually, and the increase rate is gradually slow. Imaging deviation slope decreases gradually with the increase of Mach number, and gradually tends to be zero, suggesting that imaging deviation is not sensitive to the change of the larger Mach number. In other words, the Mach number of smaller changes can lead to larger imaging deviation. As the Mach number of the aircraft increases, the slope of the imaging offset tends to be closer and closer to 0. When the Mach number of the aircraft increases to a certain extent, the change of the imaging offset will not have much influence. Therefore, in order to reduce the impact of flight speed on imaging migration, the aircraft should fly at a higher Mach number.
    XU Liang, ZHAO Shiwei, XUE Wei, and WANG Tao. Computation and analysis of aero-optic imaging deviation of a blunt nosed aircraft with Mach number 0.5-3[J]. Optoelectronics Letters, 2023, 19(1): 55
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