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    Journals >Opto-Electronic Engineering >Volume 37 >Issue 4 >Page 44 > Article
    • Opto-Electronic Engineering
    • Vol. 37, Issue 4, 44 (2010)
    Measure Method with Solid Cavity Thickness of Optical Comb Filter
    DENG Chun-lin1,2,*, CAI Wei1, ZHANG Zhi-li1, LU Jin-jun3, and QU Zhan-guo4
    Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
  • 4[in Chinese]
    • show less
    DOI: 10.3969/j.issn.1003-501x.2010.04.009 Cite this Article
    DENG Chun-lin, CAI Wei, ZHANG Zhi-li, LU Jin-jun, QU Zhan-guo. Measure Method with Solid Cavity Thickness of Optical Comb Filter[J]. Opto-Electronic Engineering, 2010, 37(4): 44 Copy Citation Text show less
    References

    [1] XIONG Yu-qing. Preparation technique of ultranarrow bandpass optical thin film filters [J]. Vacuum & Cryogenics,2005,11(3)：125-129.

    [2] LI Ming,HU Bi-chun,NIE Ming-ju. Ultra-narrow band-pass F-P interference filters based on solid cavity [J]. Optical Instruments,2007,29(1)：75-78.

    [3] LI Fang,LIN Yong-chang. Design of Narrow Bandpass Filter Used in DWDM System for Optical Fiber [J]. Journal of Beijing Institute of Technology,2001,21(5)：599-602.

    [4] LU Jin-jun. Optical ultra-narrow band-pass comb filter patent：China,CN2478125 [P]. 2004.

    [5] ZHANG Bai-sen,MA Mian-jun,XIONG Yu-qing. Design and preparation of Infrared pass-band filters with wide rejeetion band for space use [J]. Infrared,2009,30(2)：15-18.

    [6] Cabestaing Bing He,Postaire F,Ruodan J -G. Zhang. Narrow-band frequency analysis for laser-based glass thickness measurement [J]. IEEE Transactions on Instrumentation and Measurement(S0018-9456),2005,54(1)：222-227.

    [7] YANG Yu-ming,GU Pei-fu,LIU Xu. Simulation Analysis of Error Tolerance Characteristic of the Thin Film Narrow Band-pass Filter for DWDM [J]. Acta Photonica Sinica,2003,22(3)：794-797

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    DENG Chun-lin, CAI Wei, ZHANG Zhi-li, LU Jin-jun, QU Zhan-guo. Measure Method with Solid Cavity Thickness of Optical Comb Filter[J]. Opto-Electronic Engineering, 2010, 37(4): 44
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