• Chinese Optics Letters
  • Vol. 9, Issue 7, 070401 (2011)
Xi Wang1, Shali Xiao1, Miao Li1, Liuqiang Zhang1, Yulin Cao2, and Yuxiao Chen2
Author Affiliations
  • 1Key Laboratory of Optoelectronic Technology and Systems, Ministry of Education, Chongqing University, Chongqing 400030, China
  • 2Institute of Electronic Engineering, China Academy of Engineering Physics, Mianyang 621900, China
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    DOI: 10.3788/COL201109.070401 Cite this Article Set citation alerts
    Xi Wang, Shali Xiao, Miao Li, Liuqiang Zhang, Yulin Cao, Yuxiao Chen. Intensifying process of polarization ef fect within pixellated CdZnTe detectors for X-ray imaging[J]. Chinese Optics Letters, 2011, 9(7): 070401 Copy Citation Text show less
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    Data from CrossRef

    [1] Yun Long, Zhuan-Xian Xiong, Xi Zhang, Meng-Jiao Zhang, Bao-Long Lü, Ling-Xiang He. Observation of Photoassociation Spectra of Ultracold 174 Yb Atoms at 1 S 0 — 3 P 1 Inter-Combination Line . Chinese Physics Letters, 30, 073402(2013).

    Xi Wang, Shali Xiao, Miao Li, Liuqiang Zhang, Yulin Cao, Yuxiao Chen. Intensifying process of polarization ef fect within pixellated CdZnTe detectors for X-ray imaging[J]. Chinese Optics Letters, 2011, 9(7): 070401
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