Intensifying process of polarization ef fect within pixellated CdZnTe detectors for X-ray imaging

Xi Wang; Shali Xiao; Miao Li; Liuqiang Zhang; Yulin Cao; Yuxiao Chen

doi:10.3788/COL201109.070401

Journals >Chinese Optics Letters >Volume 9 >Issue 7 >Page 070401 > Article

Chinese Optics Letters
Vol. 9, Issue 7, 070401 (2011)

Intensifying process of polarization ef fect within pixellated CdZnTe detectors for X-ray imaging

Xi Wang¹, Shali Xiao¹, Miao Li¹, Liuqiang Zhang¹, Yulin Cao², and Yuxiao Chen²

Author Affiliations

¹Key Laboratory of Optoelectronic Technology and Systems, Ministry of Education, Chongqing University, Chongqing 400030, China

²Institute of Electronic Engineering, China Academy of Engineering Physics, Mianyang 621900, China

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DOI: 10.3788/COL201109.070401 Cite this Article Set citation alerts

Xi Wang, Shali Xiao, Miao Li, Liuqiang Zhang, Yulin Cao, Yuxiao Chen. Intensifying process of polarization ef fect within pixellated CdZnTe detectors for X-ray imaging[J]. Chinese Optics Letters, 2011, 9(7): 070401 Copy Citation Text

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