• Chinese Optics Letters
  • Vol. 9, Issue 7, 070401 (2011)
Xi Wang1, Shali Xiao1, Miao Li1, Liuqiang Zhang1, Yulin Cao2, and Yuxiao Chen2
Author Affiliations
  • 1Key Laboratory of Optoelectronic Technology and Systems, Ministry of Education, Chongqing University, Chongqing 400030, China
  • 2Institute of Electronic Engineering, China Academy of Engineering Physics, Mianyang 621900, China
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    DOI: 10.3788/COL201109.070401 Cite this Article Set citation alerts
    Xi Wang, Shali Xiao, Miao Li, Liuqiang Zhang, Yulin Cao, Yuxiao Chen. Intensifying process of polarization ef fect within pixellated CdZnTe detectors for X-ray imaging[J]. Chinese Optics Letters, 2011, 9(7): 070401 Copy Citation Text show less

    Abstract

    The intensifying process of polarization effect at room temperature in a pixellated Cadmium zinc telluride (CdZnTe) monolithic detector is studied. The process is attributed to the increase in build up space charges in the CdZnTe crystal, which causes an expansion of the space charge region under the irradiated area. The simulations of electric potential distributions indicate that the distorted electric potential due to the high X-ray flux is significantly changed and even deteriorated due to increasing space charges within the irradiated volume. An agreement between the space charge distribution and electric potential is discussed.
    Xi Wang, Shali Xiao, Miao Li, Liuqiang Zhang, Yulin Cao, Yuxiao Chen. Intensifying process of polarization ef fect within pixellated CdZnTe detectors for X-ray imaging[J]. Chinese Optics Letters, 2011, 9(7): 070401
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