• Opto-Electronic Engineering
  • Vol. 31, Issue 9, 53 (2004)
[in Chinese]1、2, [in Chinese]1, [in Chinese]1, and [in Chinese]1
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  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: Cite this Article
    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Heterodyne vibration measurement and signal processing for environmental micro-disturbances on phase-shifting interferometer[J]. Opto-Electronic Engineering, 2004, 31(9): 53 Copy Citation Text show less
    References

    [1] WU D,CHEN L,CHEN J B,et al.Spatial phase-shifting method for adaptive vibration resistant interferometer [J].Acta Photonica Sinica,2003,32(8):969-972.

    [2] FRESCHI A A,FREJLICH J.Adjustable phase control in stabilized interferometry [J].Opt.Lett,1995,20(6):635-637.

    [3] YAMAGUCHI I,LIU J Y,KATO J.Active phase-shifting interferometers for shape and deformation measurements [J].Opt.Eng,1996,35(10):2930-2937.

    [4] NGOI B K A,VENKATAKRISHNAN K.An acousto-optic vibrometer for measurement of vibration in ultra-precision machine tools [J].Int.J.Adv.Manuf.Technol,2000,16(4):830-834.

    [8] Analog Devices Inc.AD8302: LF-2.7GHz RF/IF Gain and Phase Detector Data sheet [EB/OL].http://www.analog.com,2002-07-01 /2002-11-04.

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    [1] Zhang Qican, Su Xianyu. Research Progress of Dynamic Three-Dimensional Shape Measurement[J]. Laser & Optoelectronics Progress, 2013, 50(1): 10001

    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Heterodyne vibration measurement and signal processing for environmental micro-disturbances on phase-shifting interferometer[J]. Opto-Electronic Engineering, 2004, 31(9): 53
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