[1] J. Robichaud, J. Schwartz, D. Landry et al.. Recent advances in reaction bonded silicon carbide optics and optical systems [C]. SPIE, 2005, 5868: 586802

[2] S. Williams, P. Deny. Overview of the production of sintered SiC optics and optical sub-assemblies [C]. SPIE, 2005, 5868: 586804

[3] Zhang Ge. The Study on Fabrication Technique of Large-Scale Silicon Carbide Mirror Blank [D]. Changchun: Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, 2008

[4] Michel Bougoin, Pierre Deny. The SiC technology is ready for the next generation of extremely large telescopes [C]. SPIE, 2004, 5494: 9～18

[5] David S. Anderson, James H. Burge. Swing-arm profilometry of aspherics [C]. SPIE, 1995, 2536: 169～179

[6] Raul R. Cordero, Ignacio Lira. Uncertainty analysis of displacements measured by phase-shifting moire interferometry [J]. Opt. Commun., 2004, 237(1～3): 25～36

[7] Tian Xiuyun, Wu Shibin, Wu Fan et al.. A data processing method in Ritchey-Common test [J]. Opto-Electronic Engineering, 2004, 31(4): 23～31

[8] Kong Xiaohui, Fan Xuewu, Ma Zhen et al.. Computer added Ritchey-Common test for large flat mirror measurement [J]. J. Applied Optics, 2010, 31(6): 984～988

[9] Yuan Lüjun, Xing Na. Study on the Ritchey-Common interferometry for large plano optics [J]. Optical Technique, 2007, 33(5): 737～744

[10] Xiaokun Wang, Lihui Wang, Longhai Yin et al.. Measurement of large aspheric surfaces by annular subaperture stitching interferometry[J]. Chin. Opt. Lett., 2007, 5(11): 645～647

[11] Paul Murphy, Jon Fleig, Greg Forbes. Subaperture stitching interferometry for testing mild aspheres [C]. SPIE, 2006, 6293: 62930J

[12] T. Marc, D. Paul, F. Greg. Sub-aperture approaches for asphere polishing and metrology [C]. SPIE, 2005, 5638: 284～299

[13] O. Masashi, O. Katsuyuki, T. Jumpei. Measurement of large plane surface shapes by connecting small-aperture interferograms [J]. Opt. Engng., 1994, 33(2): 608～613