[1] Andre Timmermannn, Jens Meinschien, Perter Bruns, et al. Next generation high-brightness diode laser offer new industrial applications[C]// SPIE, 2008, 6876: 68760U.
[4] Li Yi, Zheng Gang, Lei Jun, et al. Relation between smile effect and packaging of laser diode arrays[J]. High Power Laser and Particle Beams, 2014, 26(3): 031004. (in Chinese)
[5] Shi Guanghui. Improved method for semiconductor laser coupling[J]. Chinese Optics, 2013, 6(3): 343-351. (in Chinese)
[6] Bachmann F, Loosen P, Poprawe R. High-power Diode Laser[M]. Berlin: Springer Verlag, 2007: 40-45, 131-135.
[7] Su Zhouping, Lou Qiheng, Dong Jingxing, et al. Beam quality improvement of laser diode array by using off-axis external cavity[J]. Opt Express, 2007, 15(19): 11776-11780.
[8] Talbot C L, Friese M E J, Wang D, et al. Linewidth reduction in a large-Smile laser diode array[J]. Appl Opt, 2005, 44(29): 6264-6268.
[9] Li Yuandong, Wu Yongfu, Hu Meng, et al. Influencing factors on spectral linewidth of external cavity laser[J]. Infrared and Laser Engineering, 2014, 43(1): 94-97. (in Chinese)
[10] Hu Liming, Zhu Hongbo, Wang Lijun. High-brightness pumping module of fiber coupled diode laser[J]. Infrared and Laser Engineering, 2013, 42(2): 361-365. (in Chinese)
[11] Herzog W D, Unlu M S, Godlaerg B B, et al. Beam divergence and waist measurements of laser diodes by near-field scanning optical microscopy[J]. Appl Phys Lett, 1997, 70(6): 688-690.
[12] Mart L, Ramos J A, Mart R A. Interferometric method for characterizing the Smile of laser diode bars[J]. Optics Communications, 2007, 275: 359-371.
[13] Roehner M, Muentz H, Schroeder O, et al. Characterization device for diode-laser-stack beam propagation[C]//SPIE, 2003, 4932: 608-614.
[14] Wang Wei, Chen Huaixin. New method for centroid detecting of focal spot based on optmizing detecting window[J]. High Power Laser and Particle Beams, 2006, 18(8): 1249-1252. (in Chinese)