Fig. 1. Schematic of fabrication process for structural color samples by laser post-treatment
Fig. 2. Principles of coloration by Si/ SiO2/PS composite structure
Fig. 3. Schematic of multilayer film interference
Fig. 4. Reflection spectra of samples changing with coating time and laser scanning speed.(a) 20 s;(b) 80 s;(c) 120 s
Fig. 5. Chromaticity coordinates of samples at different coating times and laser scanning speeds
Fig. 6. Influence of coating time and scanning speed on spectral reflection of samples.(a) 50 mm/s; (b) 200 mm/s
Fig. 7. Microtopography of samples. (a) 20 s 50 mm/s; (b) 20 s 200 mm/s; (c) 80 s 50 mm/s; (d) 80 s 200 mm/s; (e) 120 s 50 mm/s; (f) 120 s 200 mm; cross section image (g) 80 s 30 mm/s, (h) 80 s 80 mm/s, (i) 80 s 140 mm/s
Fig. 8. Spectral reflection curve and chromaticity coordinate diagram of samples before and after adding SiO2 layer. (a) Spectral reflection curve; (b) chromaticity coordinate diagram
Fig. 9. SEM images of samples before and after adding SiO2 layer at different scanning speeds. (a) Si substrate 80 s 50 mm/s; (b) SiO2 substrate 80 s 50 mm/s; (c) Si substrate 80 s 200 mm/s; (d) SiO2 substrate 80 s 200 mm/s
Angle /(°) | m=1 | m=2 | m=3 | m=4 | m=5 | m=6 | m=7 |
---|
15 | 2221.0 | 1110.5 | 740.3 | 555.2 | 444.2 | 370.2 | 317.3 | 30 | 2119.5 | 1059.7 | 706.5 | 529.9 | 423.9 | 353.2 | 302.8 | 45 | 1972.3 | 986.2 | 657.4 | 493.1 | 394.5 | 328.7 | 281.8 |
|
Table 1. Theoretical wavelength values at different incident angles when the particle size is 500 nm
Angle /(°) | Reflection peak position /nm |
---|
15 | 1008.1 | 730.5 | 530.4 | 439.2 | 30 | 975.8 | 683.7 | 515.4 | 428.0 | 45 | 894.2 | 638.9 | 475.0 | 400.8 |
|
Table 2. Reflection peak position at different incidence angles when the particle size is 500 nm